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STM32L433CB 데이터시트(PDF) 145 Page - STMicroelectronics

부품명 STM32L433CB
상세설명  Ultra-low-power Arm® Cortex®-M4 32-bit MCUFPU, 100DMIPS, up to 256KB Flash, 64KB SRAM, USB FS, LCD, ext. SMPS
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제조업체  STMICROELECTRONICS [STMicroelectronics]
홈페이지  http://www.st.com
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STM32L433CB 데이터시트(HTML) 145 Page - STMicroelectronics

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STM32L433xx
Electrical characteristics
193
Static latch-up
Two complementary static tests are required on six parts to assess the latch-up
performance:
A supply overvoltage is applied to each power supply pin.
A current injection is applied to each input, output and configurable I/O pin.
These tests are compliant with EIA/JESD 78A IC latch-up standard.
6.3.13
I/O current injection characteristics
As a general rule, current injection to the I/O pins, due to external voltage below VSS or
above VDDIOx (for standard, 3.3 V-capable I/O pins) should be avoided during normal
product operation. However, in order to give an indication of the robustness of the
microcontroller in cases when abnormal injection accidentally happens, susceptibility tests
are performed on a sample basis during device characterization.
Functional susceptibility to I/O current injection
While a simple application is executed on the device, the device is stressed by injecting
current into the I/O pins programmed in floating input mode. While current is injected into
the I/O pin, one at a time, the device is checked for functional failures.
The failure is indicated by an out of range parameter: ADC error above a certain limit (higher
than 5 LSB TUE), out of conventional limits of induced leakage current on adjacent pins (out
of the -5 µA/+0 µA range) or other functional failure (for example reset occurrence or
oscillator frequency deviation).
The characterization results are given in Table 69.
Negative induced leakage current is caused by negative injection and positive induced
leakage current is caused by positive injection.
Table 68. Electrical sensitivities
Symbol
Parameter
Conditions
Class
LU
Static latch-up class
TA = +105 °C conforming to JESD78A
II
Table 69. I/O current injection susceptibility(1)
1. Guaranteed by characterization results.
Symbol
Description
Functional
susceptibility
Unit
Negative
injection
Positive
injection
IINJ
Injected current on all pins except PA4, PA5, PE8, PE9,
PE10, PE11, PE12
-5
N/A(2)
2. Injection is not possible.
mA
Injected current on PE8, PE9, PE10, PE11, PE12
-0
N/A(2)
Injected current on PA4, PA5 pins
-5
0



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