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전자부품 데이터시트 검색엔진 |
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전자부품 데이터시트 검색엔진 |
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TLE9461ES 데이터시트(PDF) 30 Page - Infineon Technologies AG |
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TLE9461ES 데이터시트(HTML) 30 Page - Infineon Technologies AG |
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30 / 140 page  TLE9461ES Lite CAN SBC Family System Features Datasheet 30 Rev.1.1 2019-09-27 Note: In case a VCC2 overtemperature event occurs in SBC Init Mode., after SBC Development Mode is entered, VCC2 is shut down. Figure 5 Block Diagram of Pin TEST for SBC Development Mode Detection In case the pin level toggles with a period faster than tTEST during the monitoring period the SBC Development Mode is not reached . The SBC remains in this mode for all operating conditions and can only be left by powering down the device (VS < VPOR,f). Note: If the SBC enters SBC Fail-Safe Mode due to VCC1 shorted to GND during the SBC Init Mode, the SBC Development is not entered and can only be activated at the next power-up of the SBC (after the VCC1 short circuit is removed). Note: The absolute maximum ratings of the pin TEST must be observed. To increase the robustness of this pin during debugging or programming a series resistor between TEST and the connector can be added (see Figure 47). SBC Development Mode detection logic TEST T test RTEST |
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