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AS9C25512M2018L 데이터시트(PDF) 25 Page - Alliance Semiconductor Corporation |
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AS9C25512M2018L 데이터시트(HTML) 25 Page - Alliance Semiconductor Corporation |
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25 / 30 page ![]() AS9C25512M2018L AS9C25256M2018L 9/24/04, v.1.2 Alliance Semiconductor P. 25 of 30 ® Identification register definitions Scan register sizes Instruction codes Instruction field Value Description Revision number (31:28) TBD Version Number Device depth (27:12) TBD ALSC part number JEDEC ID code (11:1) 00001010010 Manufacturer Identity Code (ALSC) Indicator Bit (0) 1 ID Register presence indicator Register name Bit size Instruction Register (IR) 4 Bypass Register (BYR) 1 Identification Register (IDR) 32 Boundary Scan Register (BSR) 112 Instruction Code Description Selected Reg EXTEST 0000 Forces contents of the BSR onto the device outputs. BSR SAMPLE/PRELOAD 0001 Samples the I/O ring contents. Preloads test data into the BSR. BSR IDCODE 0010 Loads the IDR with the vendor ID code and places the register between TDI and TDO. IDR CLAMP 0011 Forces contents of the BSR onto the device outputs. BYR HIGHZ 0100 Forces all device 2-state and 3-state outputs to High-Z. BYR RESERVED 0101 - 1110 Reserved states. Do not use. BYR BYPASS 1111 Places the BYR between TDI and TDO. BYR |
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