| 전자부품 데이터시트 검색엔진 |
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AT24CSW01X 데이터시트(PDF) 12 Page - Microchip Technology |
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AT24CSW01X 데이터시트(HTML) 12 Page - Microchip Technology |
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12 / 41 page ![]() 4.5.2 Pin Capacitance Table 4-5. Pin Capacitance(1) Symbol Test Condition Max. Units Conditions CI/O Input/Output Capacitance (SDA) 8 pF VI/O = 0V CIN Input Capacitance (SCL) 6 pF VIN = 0V Note: 1. This parameter is characterized but is not 100% tested in production. 4.5.3 EEPROM Cell Performance Characteristics Table 4-6. EEPROM Cell Performance Characteristics Operation Test Condition Min. Max. Units Write Endurance(1) TA = +25°C, VCC (min.) < VCC < VCC (max.), Byte or Page Write mode 1,000,000 — Write Cycles Data Retention(1) TA = +55°C 100 — Years Note: 1. Performance is determined through characterization and the qualification process. AT24CSW01X/AT24CSW02X Electrical Characteristics © 2020-2021 Microchip Technology Inc. and its subsidiaries Datasheet DS20006396B-page 12 |
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