IRFPG30

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Vishay Siliconix

S22-0057-Rev. C, 31-Jan-2022

7

Document Number: 91252

THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT

Fig. 18 - For N-Channel

Vishay Siliconix maintains worldwide manufacturing capability. Products may be manufactured at one of several qualified locations. Reliability data for Silicon

Technology and Package Reliability represent a composite of all qualified locations. For related documents such as package/tape drawings, part marking, and

P.W.

Period

di/dt

Diode recovery

dv/dt

Ripple ≤ 5 %

Body diode forward drop

Re-applied

voltage

Reverse

recovery

current

Body diode forward

current

a

V

DD

I

SD

Driver gate drive

D.U.T. I

D.U.T. V

Inductor current

D =

P.W.

Period

+

-

+

+

+

-

-

-

Note

a. V

Peak Diode Recovery dv/dt Test Circuit

V

DD

• dv/dt controlled by R

g

• Driver same type as D.U.T.

• I

• D.U.T. - device under test

D.U.T.

Circuit layout considerations

• Low stray inductance

• Ground plane

• Low leakage inductance

current transformer

R

g

2

1

2

1

3

4

4

3