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ADPA7008AEHZ-R7 데이터시트(PDF) 5 Page - Analog Devices |
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ADPA7008AEHZ-R7 데이터시트(HTML) 5 Page - Analog Devices |
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5 / 28 page ![]() Data Sheet ADPA7008 ABSOLUTE MAXIMUM RATINGS analog.com Rev. 0 | 5 of 28 Table 5. Parameter Rating Drain Bias Voltage (VDDx) 6.0 V VGGx −1.6 V to 0 V RF Input Power (RFIN) 22 dBm Continuous Power Dissipation (PDISS), TA = 85°C (Derate 123 mW/°C Above 85°C) 11.1 W Temperature Maximum Channel to Maintain 1,000,000 Hour Mean Time to Failure (MTTF) 175°C Quiescent Channel (TJ = 85°C, VDD = 5 V, IDQ = 1500 mA) 130°C Storage −65°C to +150°C Operating −40°C to +85°C Stresses at or above those listed under Absolute Maximum Ratings may cause permanent damage to the product. This is a stress rating only; functional operation of the product at these or any other conditions above those indicated in the operational section of this specification is not implied. Operation beyond the maximum operat- ing conditions for extended periods may affect product reliability. THERMAL RESISTANCE Overall thermal performance is directly linked to printed circuit board (PCB) design and operating environment. Careful attention to PCB thermal design is required. θJC is the channel to case thermal resistance (the channel to the exposed metal ground pad on the underside of the device). Table 6. Thermal Resistance Package Type1 θJC Unit EH-18-1 Quiescent, TBASE = 85°C 6.0 °C/W Worst Case2, TBASE = 85°C 8.1 °C/W 1 The thermal resistance varies with operating conditions. 2 The worst case across all specified operating conditions. ELECTROSTATIC DISCHARGE (ESD) RATINGS The following ESD information is provided for handling of ESD sensitive devices in an ESD protected area only. Human body model (HBM) per ANSI/ESDA/JEDEC JS-001. ESD Ratings for ADPA7008 Table 7. ADPA7008, 18-Terminal LCC_HS ESD Model Withstand Threshold (V) Class HBM ±250 1A ESD CAUTION ESD (electrostatic discharge) sensitive device. Charged devi- ces and circuit boards can discharge without detection. Although this product features patented or proprietary protection circuitry, damage may occur on devices subjected to high energy ESD. Therefore, proper ESD precautions should be taken to avoid performance degradation or loss of functionality. |
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