SCAS641

– JULY 2000

6

POST OFFICE BOX 655303

DALLAS, TEXAS 75265

recommended operating conditions (see Note 2)

MIN

NOM†

MAX

UNIT

Supply voltage, VDD

3.135

3.465

V

High-level input voltage, VIH

2

VDD +

0.3 V

V

Low-level input voltage, VIL

GND

–

0.3 V

0.8

V

Input voltage, VI

0

VDD

V

HCLK/HCLK

–20

High level output currentIOH

3VMREF/3VMREF

–15

mA

High-level output current, IOH

48MHz, REFx

–16

mA

PCIx, 3V66x

–15

HCLK/HCLK

5

A

Low level output currentIOL

3VMREF/3VMREF

10

Low-level output current, IOL

48MHz, REFx

10

mA

PCIx, 3V66x

10

Reference frequency, f(XIN)‡

Test mode

14

MHz

Crystal frequency, f(XTAL)§

Normal mode

13.8

14.318

14.8

MHz

Operating free-air temperature, TA

0

85

C

† All nominal values are measured at their respective nominal VDD values.

‡ Reference frequency is a test clock driven on the XIN input during the device test mode and normal mode. In test mode, XIN can be driven

externally up to f(XIN) = 16 MHz. If XIN is driven externally, XOUT is floating.

§ This is a series fundamental crystal with fO = 14.31818 MHz.

NOTES:

4. Unused inputs must be held high or low to prevent them from floating.

5.VIH, VIL: All input levels referenced to VDD = 3.30 V.