| 전자부품 데이터시트 검색엔진 |
|
STM32H753II 데이터시트(PDF) 132 Page - STMicroelectronics |
|
|
|||||||||||||||||||||||||||||
STM32H753II 데이터시트(HTML) 132 Page - STMicroelectronics |
|
132 / 361 page ![]() Electrical characteristics (rev Y) STM32H753xI 132/360 DS12117 Rev 8 Table 52. Flash memory programming Symbol Parameter Conditions Min(1) Typ Max(1) Unit tprog Word (266 bits) programming time Program/erase parallelism x 8 - 290 580(2) µs Program/erase parallelism x 16 - 180 360 Program/erase parallelism x 32 - 130 260 Program/erase parallelism x 64 - 100 200 tERASE128KB Sector (128 KB) erase time Program/erase parallelism x 8 - 2 4 s Program/erase parallelism x 16 - 1.8 3.6 Program/erase parallelism x 32 - 1.1 2.2 Program/erase parallelism x 64 - 1 2 tME Mass erase time Program/erase parallelism x 8 - 13 26 Program/erase parallelism x 16 - 8 16 Program/erase parallelism x 32 - 6 12 Program/erase parallelism x 64 - 5 10 Vprog Programming voltage Program parallelism x 8 1.62 - 3.6 V Program parallelism x 16 Program parallelism x 32 Program parallelism x 64 1.8 - 3.6 1. Guaranteed by characterization results. 2. The maximum programming time is measured after 10K erase operations. Table 53. Flash memory endurance and data retention Symbol Parameter Conditions Value Unit Min(1) NEND Endurance TJ = –40 to +125 °C (6 suffix versions) 10 kcycles tRET Data retention 1 kcycle at TA = 85 °C 30 Years 10 kcycles at TA = 55 °C 20 1. Guaranteed by characterization results. |
|
링크 URL |
| ALLDATASHEET 가 귀하에 도움이 되셨나요? [ DONATE ] |
Alldatasheet는? | 광고문의 | 운영자에게 연락하기 | 개인정보취급방침 | 링크 투 데이터시트 | 링크교환 | 제조사별 검색 All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |