STM32H757AI datasheet(117/251 Pages) STMICROELECTRONICS

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DS12931 Rev 1

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STM32H757xI

Electrical characteristics

230

6.3.7

Supply current characteristics

The current consumption is a function of several parameters and factors such as the

operating voltage, ambient temperature, I/O pin loading, device software configuration,

operating frequencies, I/O pin switching rate, program location in memory and executed

binary code.

The current consumption is measured as described in Figure 14: Current consumption

measurement scheme.

All the run-mode current consumption measurements given in this section are performed

with a CoreMark code.

Typical and maximum current consumption

The MCU is placed under the following conditions:

•

All I/O pins are in analog input mode.

•

All peripherals are disabled except when explicitly mentioned.

•

The Flash memory access time is adjusted with the minimum wait states number,

depending on the fACLK frequency (refer to the table “Number of wait states according to

CPU clock (frcc_c_ck) frequency and VCORE range” available in the reference manual).

•

When the peripherals are enabled, the AHB clock frequency is the CPU

1 frequency

divided by 2 and the APB clock frequency is AHB clock frequency divided by 2.

The parameters given in the below tables are derived from tests performed under ambient

temperature and supply voltage conditions summarized in Table 23: General operating

conditions.

VREFINT_DIV1 1/4 reference voltage

VREFINT

VREFINT_DIV2 1/2 reference voltage

VREFINT_DIV3 3/4 reference voltage

The shortest sampling time for the application can be determined by multiple iterations.

Guaranteed by design.

Table 30. Embedded reference voltage (continued)

Symbol

Parameter

Conditions

Min

Typ

Max

Unit

Table 31. Internal reference voltage calibration values

Symbol

Parameter

Memory address

VREFIN_CAL Raw data acquired at temperature of 30 °C, VDDA = 3.3 V

1FF1E860 - 1FF1E861

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