33889 datasheet(21/60 Pages) FREESCALE

21 / 60 page

Analog Integrated Circuit Device Data

Freescale Semiconductor

33889

ELECTRICAL CHARACTERISTICS

DYNAMIC ELECTRICAL CHARACTERISTICS

Figure 4. Test Circuit for AC Characteristics

Figure 5. ISO loop time without bus failure

Figure 6. ISO Loop Time with Bus Failure

Edge Count Difference Between CANH and CANL for Failures

1, 2, 5 Detection (Failure bit set, Normal Mode)

ECDF

Edge Count Difference Between CANH And CANL For

Failures 1, 2, 5 Recovery (Normal Mode)

ECDR

TX Permanent Dominant Timer Disable Time

(Normal Mode And Failure Mode)

tTX,D

0.75

4.0

TX Permanent Dominant Timer Enable Time

(Normal Mode And Failure Mode)

tTX,E

µs

Table 5. Dynamic Electrical Characteristics (continued)

VSUP From 5.5 V to 18 V, V2INT from 4.75 to 5.25 V and TJ from -40°C to 150°C unless otherwise noted. Typical values

noted reflect the approximate parameter means at TA = 25°C under nominal conditions unless otherwise noted.

Conditions

Symbol

Min

Typ

Max

Unit

CANH

CANL

VDD

R = 100ohms

C = 1nF

CANH

CANL

1nF

500

RtH

RtL

MC33889D

RcanL

RcanH

RcanL = RcanH = 125 ohms

CANH

CANL

1nF

500

RtH

RtL

RcanL

RcanH

MC33889D

Generator (*)

Bus

Failure

Vbat

RcanL = RcanH = 125 ohms

except for failure CANH short to CANL

(Rcanl = 1M ohms)

CANL short to gnd, Vdd, Vbat

CANHshort to gnd, Vdd, Vbat

CANL short to CANH

CANL and CANH open

(*) List of failure

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