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MPC8280 데이터시트(PDF) 537 Page - Freescale Semiconductor, Inc |
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MPC8280 데이터시트(HTML) 537 Page - Freescale Semiconductor, Inc |
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537 / 1386 page ![]() IEEE 1149.1 Test Access Port MPC8280 PowerQUICC II Family Reference Manual, Rev. 1 Freescale Semiconductor 13-3 Figure 13-2. TAP Controller State Machine 13.3 Boundary Scan Register The MPC8280’s scan chain implementation has a 878-bit boundary scan register that contains bits for all device signal, clock pins, and associated control signals. The PORESET_B and XFC pins are associated with analog signals and are not included in the boundary scan register. An IEEE-1149.1-compliant boundary-scan register has been included on the MPC8280 that can be connected between TDI and TDO when EXTEST or SAMPLE/PRELOAD instructions are selected. It is used for capturing signal pin data on the input pins, forcing fixed values on the output signal pins, and selecting the direction and drive characteristics (a logic value or high impedance) of the bidirectional and three-state signal pins. Figure 13-3, Figure 13-4, Figure 13-5, and Figure 13-6 show various cell types. Test Logic Reset Run—Test/Idle Select—DR_SCAN Capture—DR Shift—DR Exit1—DR Pause—DR Exit2—DR Update—DR Select—IR_SCAN Capture—IR Shift—IR Exit1—IR Pause—IR Exit2—IR Update—IR 00 0 0 1 1 1 0 0 0 0 1 1 1 1 1 0 0 1 1 1 1 |
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