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MPC8280 데이터시트(PDF) 539 Page - Freescale Semiconductor, Inc |
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MPC8280 데이터시트(HTML) 539 Page - Freescale Semiconductor, Inc |
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539 / 1386 page ![]() IEEE 1149.1 Test Access Port MPC8280 PowerQUICC II Family Reference Manual, Rev. 1 Freescale Semiconductor 13-5 Figure 13-5. Output Control Cell (IO.CTL) Figure 13-6. General Arrangement of Bidirectional Pin Cells The control bit value controls the output function of the bidirectional pin. One or more bidirectional data cells can be serially connected to a control cell. Bidirectional pins include two scan cell for data (IO.Cell) as shown in Figure 13-6 and these bits are controlled by the cell shown in Table 13-5. 13.4 Instruction Register The MPC8280 JTAG implementation includes the public instructions (EXTEST, SAMPLE/PRELOAD, and BYPASS) and also supports the CLAMP instruction. One additional public instruction (HI-Z) can be used to disable all device output drivers. The MPC8280 includes an 8-bit instruction register (no parity) that consists of a shift register with four parallel outputs. Data is transferred from the shift register to the 1 1 MUX G1 1 1 MUX G1 C D C D From Last Cell Clock DR Update DR Shift DR 1 — EXTEST | Clamp To Output Buffer 0 — Otherwise To Next Cell Output Control Logic from System I/O Pin From Last Cell Output Data Input Data Output Enable I.OBS EN from System Logic O.PIN I/O.CTL To Next Pin Pair To Next Cell |
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