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LSM6DSV80X 데이터시트(PDF) 14 Page - STMicroelectronics |
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LSM6DSV80X 데이터시트(HTML) 14 Page - STMicroelectronics |
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14 / 181 page ![]() 7. Accelerometer noise density in normal mode is independent of the ODR and FS setting. 8. Noise RMS related to BW = ODR/2. 9. This ODR is available when the accelerometer is in low-power mode. 10. Values specified by design. 11. The sign of the linear acceleration self-test output change is defined by the ST_XL_[1:0] bits in a dedicated register for all axes. 12. The linear acceleration self-test output change is defined with the device in stationary condition as the absolute value of: OUTPUT[LSb] (self-test enabled) - OUTPUT[LSb] (self-test disabled). 1LSb = 0.061 mg at ±2 g full scale. 13. Accelerometer self-test limits are full-scale independent. 14. The sign of the angular rate self-test output change is defined by the ST_G_[1:0] bits in a dedicated register for all axes. 15. The angular rate self-test output change is defined with the device in stationary condition as the absolute value of: OUTPUT[LSb] (self-test enabled) - OUTPUT[LSb] (self-test disabled). 1LSb = 70 mdps at ±4000 dps full scale. LSM6DSV80X Module specifications DS14764 - Rev 1 page 14/181 |
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