 |
전자부품 데이터시트 검색엔진 |
|
|
전자부품 데이터시트 검색엔진 |
|
L9300 데이터시트(PDF) 157 Page - STMicroelectronics |
|
|
|||||||||||||||||||||||||||||
L9300 데이터시트(HTML) 157 Page - STMicroelectronics |
|
|
157 / 178 page  Figure 68. Analog trimming mask concept GADG2707170800PS Diagnostic comparators The off-state diagnostic comparators have analog self test implemented to detect latent faults. Self test structure is shown in the next figure and it can be enabled through dedicated SPI bit, independent of each channel, only if the off state diagnostic is kept disabled. Once triggered, the self test is kept active until SPI bit removal or until enable of off state diagnostic; if analog self test fails a warning flag is set in the Exception registers, while off state diagnostic output is masked. Figure 69. Diagnostic analog self test basic implementation L9300 Functional safety DS12258 - Rev 5 page 157/178 |
|
링크 URL |
| ALLDATASHEET 가 귀하에 도움이 되셨나요? [ DONATE ] |
Alldatasheet는? | 광고문의 | 운영자에게 연락하기 | 개인정보취급방침 | 링크 투 데이터시트 | 링크교환 | 제조사별 검색 All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |
Korean ▼
English
Chinese
German
Japanese
Russian
Korean
Spanish
French
Italian
Portuguese
Polish
Vietnamese
Indian
Mexican
British
New Zealand
