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M39832NE 데이터시트(PDF) 31 Page - STMicroelectronics |
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M39832NE 데이터시트(HTML) 31 Page - STMicroelectronics |
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31 / 36 page ![]() Symbol Parameter M39832 Unit -120 -150 Min Max Min Max tWHQ7V1 (2) Write Enable High to DQ7 Valid (Program, W Controlled) 10 10 µs tWHQ7V2 (2) Write Enable High to DQ7 Valid (Sector Erase, W Controlled) 1.5 30 1.5 30 sec tEHQ7V1 (2) Flash Block Enable High to DQ7 Valid (Program, EF Controlled) 10 10 µs tEHQ7V2 (2) Flash Block Enable High to DQ7 Valid (Sector Erase, EF Controlled) 1.5 30 1.5 30 sec tQ7VQV Q7 Valid to Output Valid (Data Polling) 50 55 ns Notes: 1. All other timings are defined in Read AC Characteristics table. 2. tWHQ7V is the Program or Erase time. Table 16. Data Polling and Toggle Bit AC Characteristics (1) (TA = 0 to 70 °C or –40 to 85°C; VCC = 2.7V to 3.6V) Parameter M39832 Unit Min Typ Typical after 100k W/E Cycles Max Flash array Erase (Preprogrammed) 5 5 sec Flash array Erase 12 12 sec Flash array Block Erase 2.4 sec Parameter Block Erase 2.3 sec Main Block (32Kb) Erase 2.7 sec Main Block (64Kb) Erase 3.3 15 sec Chip Program (Byte) 8 8 sec Byte Program 10 10 µs Word Program 20 20 µs Program/Erase Cycles (per Block) 100,000 cycles Table 17. Program, Erase Times and Program, Erase Endurance Cycles (Flash Block) (TA = 0 to 70 °C; VCC = 2.7V to 3.6V) 31/36 M39832 |
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