| 전자부품 데이터시트 검색엔진 |
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AT80C51RA2-RLSIV 데이터시트(PDF) 61 Page - ATMEL Corporation |
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AT80C51RA2-RLSIV 데이터시트(HTML) 61 Page - ATMEL Corporation |
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61 / 86 page ![]() 61 4188F–8051–01/08 AT/TS8xC51Rx2 4. Capacitance loading on Ports 0 and 2 may cause spurious noise pulses to be superimposed on the VOLs of ALE and Ports 1 and 3. The noise is due to external bus capacitance discharging into the Port 0 and Port 2 pins when these pins make 1 to 0 transitions during bus operation. In the worst cases (capacitive loading 100pF), the noise pulse on the ALE line may exceed 0.45V with maxi VOL peak 0.6V. A Schmitt Trigger use is not necessary. 5. Typicals are based on a limited number of samples and are not guaranteed. The values listed are at room temperature and 5V. 6. Under steady state (non-transient) conditions, IOL must be externally limited as follows: Maximum IOL per port pin: 10 mA Maximum IOL per 8-bit port: Port 0: 26 mA Ports 1, 2, 3 and 4 and 5 when available: 15 mA Maximum total IOL for all output pins: 71 mA If IOL exceeds the test condition, VOL may exceed the related specification. Pins are not guaranteed to sink current greater than the listed test conditions. 7. For other values, please contact your sales office. 8. Operating ICC is measured with all output pins disconnected; XTAL1 driven with TCLCH, TCHCL = 5 ns (see Figure 11-5.), VIL = VSS + 0.5 V, VIH = VCC - 0.5V; XTAL2 N.C.; EA = Port 0 = VCC; RST = VSS. The internal ROM runs the code 80 FE (label: SJMP label). ICC would be slightly higher if a crystal oscillator is used. Measurements are made with OTP products when possible, which is the worst case. Figure 11-1. ICC Test Condition, under reset Figure 11-2. Operating ICC Test Condition EA VCC VCC ICC (NC) CLOCK SIGNAL VCC All other pins are disconnected. RST XTAL2 XTAL1 VSS VCC P0 EA VCC VCC ICC (NC) CLOCK SIGNAL All other pins are disconnected. RST XTAL2 XTAL1 VSS VCC P0 Reset = Vss after a high pulse during at least 24 clock cycles |
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