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IXP45X 데이터시트(PDF) 109 Page - Intel Corporation

부품명 IXP45X
상세설명  Product Line of Network Processors
PDF  148 Pages
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제조업체  INTEL [Intel Corporation]
홈페이지  http://www.intel.com
Logo INTEL - Intel Corporation

IXP45X 데이터시트(HTML) 109 Page - Intel Corporation

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Intel® IXP45X and Intel® IXP46X Product Line of Network Processors
August 2006
Datasheet
Document Number: 306261-004US
109
Datasheet—Intel® IXP45X and Intel® IXP46X Product Line of Network Processors
5.5.4
UTOPIA Level 2 DC Parameters
5.5.5
MII/SMII DC Parameters
5.5.6
MDI DC Parameters
Table 33.
UTOPIA Level 2 DC Parameters
Symbol
Parameter
Conditions
Min.
Typ.
Max.
Units
Notes
VIH
Input-high voltage
2.0
V
VIL
Input-low voltage
0.8
V
VOH
Output-high voltage
IOUT = -8 mA
2.4
V
VOL
Output-low voltage
IOUT = 8 mA
0.5
V
IOH
Output current at high
voltage
VOH > 2.4 V
-8
mA
IOL
Output current at low
voltage
VOL < 0.5 V
8
mA
IIL
Input-leakage current
0 < VIN < VCCP
-10
10
µA
1
CIN
Input-pin capacitance
5
pF
2
COUT
I/O or output pin
capacitance
5pF
2
Notes:
1.
Input leakage currents include hi-Z output leakage for all bidirectional buffers with tri-state outputs.
2.
These values are typical values seen by the manufacturing process and are not tested.
Table 34.
MII/SMII DC Parameters
Symbol
Parameter
Conditions
Min.
Typ.
Max.
Units
Notes
VIH
Input-high voltage
2.0
V
VIL
Input-low voltage
0.8
V
VOHMII
Output-high voltage
IOUT = - 6 mA
2.4
V
VOLMII
Output-low voltage
IOUT = 6 mA
0.4
V
VOHSMII
Output-high voltage
IOUT = -10 mA
2.4
V
VOLSMII
Output-low voltage
IOUT = 10mA
0.4
V
IIL
Input-leakage current
0 < VIN < VCCP
-10
10
µA
CIN
Input-pin capacitance
5
pF
1
Notes:
1.
These values are typical values seen by the manufacturing process and are not tested.
Table 35.
MDI DC Parameters (Sheet 1 of 2)
Symbol
Parameter
Conditions
Min.
Typ.
Max.
Units
Notes
VIH
Input-high voltage
2.0
V
VIL
Input-low voltage
0.8
V
VOH
Output-high voltage
IOUT = - 6 mA
2.4
V
VOL
Output-low voltage
IOUT = 6 mA
0.4
V
Notes:
1.
These values are typical values seen by the manufacturing process and are not tested.



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