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MIC3003GML 데이터시트(PDF) 37 Page - Micrel Semiconductor

부품명 MIC3003GML
상세설명  FOM Management IC with Internal Calibration
PDF  75 Pages
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제조업체  MICREL [Micrel Semiconductor]
홈페이지  http://www.micrel.com
Logo MICREL - Micrel Semiconductor

MIC3003GML 데이터시트(HTML) 37 Page - Micrel Semiconductor

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Micrel, Inc.
MIC3003
November 2009
37
M9999-111209-C
hbwhelp@micrel.com or (408) 955-1690
Test and Calibration Features
Numerous features are included in the MIC3003 to
facilitate development, testing, and diagnostics. These
features are available via registers in the OEM area. As
shown in Table 22, these features include:
Function
Description
Control
Register(s)
Analog loop-back
Provides analog visibility of op-amp and DAC outputs via the ADC
OEMCFG0
Fault comparator disable control
Disables the fault comparator
OEMCAL0
Fault comparator spin-on-channel
mode
Selects a single fault comparator channel
OEMCAL0
Fault comparator output read-back
Allows host to read individual fault comparator outputs
OEMRD
TRSOUT, /INT read-back
Allows host to read the state of these pins
OEMRD
Inhibit EEPROM write cycles
Speeds repetitive writes to registers backed up by NVRAM
OEMCAL0
APC calibration mode
Allows direct writes to MODDAC and APCDAC (temperature
compensation not used)
OEMCAL0
Continuity checking
Forcing of RXLOS, TXFAULT, /INT
OEMCAL0
Halt A/D
Stops A/D conversions; ADC in one-shot mode
OEMCAL1
ADC idle flag
Indicates ADC status
OEMCAL1
A/D one-shot mode
Performs a single A/D conversion on the selected input channel
OEMCAL1
A/D spin-on-channel mode
Selects a single input channel
OEMCAL1
Channel selection
Selects ADC or fault comparator channel for spin-on-channel
modes
OEMCAL1
LUT index read-back
Permits visibility of the LUT index calculated by the state-machine
LUTINDX
Manufacturer and device ID registers
Facilitates presence detection and version control
MFG_ID,
DEV_ID
Table 22. Test and Diagnostic Features



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