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전자부품 데이터시트 검색엔진 |
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전자부품 데이터시트 검색엔진 |
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MLZ2012A3R3W 데이터시트(PDF) 46 Page - Texas Instruments |
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MLZ2012A3R3W 데이터시트(HTML) 46 Page - Texas Instruments |
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46 / 68 page  Test Options on the EVM www.ti.com 8.3 Noise with Common Reference on Negative Inputs There is an option in ADS1299 to connect all the channels negative inputs to a common reference. This can be accomplished by giving a signal on SRB1 pin and setting the bit SRB1 bit in MISC1 register. There is an option on board to test out the channel noise performance with this setting. On JP81 a jumper on (3- 4) and (5-6) is needed. On JP8 a jumper (1-2) is required. These settings routes the common mode voltage VCM on BIAS_ELEC to all the positive inputs. It also connects BIAS_ELEC to REF_ELEC via R11 (5K). REF_ELEC is connected to SRB1 pin on ADS1299. The noise in this test includes noise of two 5K resistors and the channel noise. The SRB1 control switch must be set as shown in Figure 55.The snapshot of the scope in the analysis tab is shown in Figure 56. The average peak-to-peak noise for this test is 1.28µV. Figure 55. MISC1 Register Setting for SRB1 46 EEG Front-End Performance Demonstration Kit SLAU443 – May 2012 Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated |
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