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JS28F256P30B95A 데이터시트(PDF) 59 Page - Micron Technology

부품명 JS28F256P30B95A
상세설명  Numonyx StrataFlash Embedded Memory
PDF  97 Pages
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제조업체  MICRON [Micron Technology]
홈페이지  http://www.micron.com
Logo MICRON - Micron Technology

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August 2008
Datasheet
Order Number: 306666-12
59
P30
R301
tAVCH/L
Address setup to CLK
9
-
ns
1
R302
tVLCH/L
ADV# low setup to CLK
9
-
ns
R303
tELCH/L
CE# low setup to CLK
9
-
ns
R304
tCHQV / tCLQV
CLK to output valid
-
17
ns
R305
tCHQX
Output hold from CLK
3
-
ns
1,7
R306
tCHAX
Address hold from CLK
10
-
ns
1,4,7
R307
tCHTV
CLK to WAIT valid
-
17
ns
1,7
R311
tCHVL
CLK Valid to ADV# Setup
3
-
ns
1
R312
tCHTX
WAIT Hold from CLK
3
-
ns
1,7
Notes:
1.
See
Figure 18, “AC Input/Output Reference Waveform” on page 55 for timing measurements and max
allowable input slew rate.
2.
OE# may be delayed by up to tELQV – tGLQV after CE#’s falling edge without impact to tELQV.
3.
Sampled, not 100% tested.
4.
Address hold in synchronous burst mode is tCHAX or tVHAX, whichever timing specification is satisfied first.
5.
Please see the latest P30 Spec Update for synchronous burst operation with the TSOP package.
6.
Synchronous read mode is not supported with TTL level inputs.
7.
Applies only to subsequent synchronous reads.
Table 31: AC Read Specifications for 256/512-Mbit Densities (Sheet 3 of 3)
Num
Symbol
Parameter
Speed
Min
Max
Unit
Notes
Table 32: AC Read Specification differences for 65nm
Num
Symbol
Parameter
Min
Max
Unit
Notes
Asynchronous Specifications
R1
tAVAV
Read cycle time
100
-
ns
2
TSOP
110
ns
2
R2
tAVQV
Address to output valid
-
100
ns
2
TSOP
110
ns
2
R3
tELQV
CE# low to output valid
-
100
ns
2
TSOP
110
ns
2
R103
tVLQV
ADV# low to output valid
-
100
ns
1,2
TSOP
110
ns
2
Notes:
1.
See
Figure 18, “AC Input/Output Reference Waveform” on page 55 for timing measurements and
max allowable input slew rate.
2.
This is the recommended specification for all new designs supporting both 130nm and 65nm lithos, or for new designs
that will use the 65nm lithography.



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