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ADM1026JSTZ-R7 데이터시트(PDF) 30 Page - ON Semiconductor

부품명 ADM1026JSTZ-R7
상세설명  Complete Thermal System Management Controller
PDF  55 Pages
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제조업체  ONSEMI [ON Semiconductor]
홈페이지  http://www.onsemi.com
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Notes:
For a NAND tree test to work, all outputs (INT,
RSTMAIN, RSTSTBY, and PWM) must remain high
during the test.
When generating test waveforms, allow for a typical
propagation delay of 500 ns through the NAND tree.
If any of the inputs shown in Figure 55 are unused, they
should not be connected direct to ground, but via a
resistor such as 10 k
W. This allows the automatic test
equipment (ATE) to drive every input high so that the
NAND tree test can be properly carried out.
Figure 56. NAND Tree Test Taking Inputs High in Turn
GPIO16
GPIO15
GPIO14
GPIO13
GPIO12
GPIO11
GPIO10
GPIO9
GPIO8
FAN0
FAN3
FAN4
FAN5
FAN6
FAN7
CI
INT
NTESTOUT
FAN1
FAN2
SCL
SDA
In the event of an input being nonfunctional (stuck high or
low) or two inputs shorted together, the output pattern is
different. Some examples are given in Figure 58 through
Figure 60.
Figure 58 shows the effect of one input being stuck low.
The output pattern is normal until the stuck input is reached.
Because that input is permanently low, neither it nor any
inputs further up the tree can have any effect on the output.
Figure 57. NAND Tree Test Taking Inputs Low in Turn
INT
CI
SDA
SCL
FAN7
FAN6
FAN3
FAN2
FAN1
GPIO11
GPIO12
GPIO15
FAN5
FAN4
FAN0
GPIO10
GPIO13
GPIO14
GPIO9
GPIO8
NTESTOUT
GPIO16
Figure 58. NAND Tree Test with GPIO11 Stuck Low
GPIO16
GPIO15
GPIO14
GPIO13
GPIO12
GPIO11
GPIO10
GPIO9
GPIO8
FAN0
NTESTOUT
FAN1
Figure 59 shows the effect of one input being stuck high.
Taking GPIO12 high should take the output high. However,
the next input up the tree, GPIO11, is already high, so the
output immediately goes low again, causing a missing pulse
in the output pattern.



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