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TSL2583 데이터시트(PDF) 5 Page - ams AG

부품명 TSL2583
상세설명  LIGHT-TO-DIGITAL CONVERTER
PDF  33 Pages
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제조업체  AMSCO [ams AG]
홈페이지  http://www.ams.com
Logo AMSCO - ams AG

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TSL2581, TSL2583
LIGHT-TO-DIGITAL CONVERTER
TAOS134A − JULY 2012
4
r
r
Copyright
E 2012, TAOS Inc.
The LUMENOLOGY
r Company
www.taosinc.com
Electrical Characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
I
Supply current
Active
175
250
μA
IDD
Supply current
Power down — I2C activity
3
10
μA
V
INT SDA output low voltage
3 mA sink current
0
0.4
V
VOL
INT, SDA output low voltage
6 mA sink current
0
0.6
V
I LEAK
Leakage current
−5
5
μA
Operating Characteristics, VDD = 3 V, TA = 255C, (unless otherwise noted) (Notes 1, 2, 3, and 4)
PARAMETER
TEST CONDITIONS
CHANNEL
MIN
TYP
MAX
UNIT
fosc
Oscillator frequency
705
750
795
kHz
Dark ADC count value
Ee = 0, ATIME = 0xB6 (200 ms),
Ch0
0
1
5
counts
Dark ADC count value
Ee = 0, ATIME = 0xB6 (200 ms),
gain = 16
×
Ch1
0
1
5
counts
ATIME
0xDB (100 ms)
Ch0
37887
Full scale ADC count value
ATIME = 0xDB (100 ms)
Ch1
37887
counts
Full scale ADC count value
ATIME
0x6C (400 ms)
Ch0
65535
counts
ATIME = 0x6C (400 ms)
Ch1
65535
λp = 625 nm, ATIME = 0xF6 (27 ms)
Ch0
4000
5000
6000
ADC count value
λp = 625 nm, ATIME = 0xF6 (27 ms)
Ee = 171.6 μW/cm2, gain = 16
×
Ch1
700
counts
ADC count value
λp = 850 nm, ATIME = 0xF6 (27 ms)
Ch0
4000
5000
6000
counts
λp = 850 nm, ATIME = 0xF6 (27 ms)
Ee = 220 μW/cm2, gain = 16
×
Ch1
2750
λ
625 nm
10 8
15 8
20 8
ADC count value ratio: Ch1/Ch0
λp = 625 nm
10.8
15.8
20.8
%
ADC count value ratio: Ch1/Ch0
λ
850 nm
41
55
68
%
ADC count value ratio: Ch1/Ch0
λp = 850 nm
41
55
68
%
λ
625 nm ATIME
0xF6 (27 ms)
Ch0
29.1
R
Irradiance responsivity
λp = 625 nm, ATIME = 0xF6 (27 ms)
Ch1
4
counts/
(
μW/
Re
Irradiance responsivity
λ
850 nm ATIME
0xF6 (27 ms)
Ch0
22.8
(
μW/
cm2)
λp = 850 nm, ATIME = 0xF6 (27 ms)
Ch1
12.5
cm2)
8
×
Ch0
7
8
9
8
×
Ch1
7
8
9
Gain scaling (relative to 1
×)
16
×
Ch0
15
16
17
×
Gain scaling (relative to 1
×)
16
×
Ch1
15
16
17
×
111
×, decoupling capacitor 25 mm
Ch0
97
107
115
111
×, decoupling capacitor 25 mm
from VDD pin (Note 5)
Ch1
100
115
125
NOTES: 1. Optical measurements are made using small-angle incident radiation from light-emitting diode optical sources. Visible 640 nm LEDs
and infrared 850 nm LEDs are used for final product testing for compatibility with high-volume production.
2. The 625 nm irradiance Ee is supplied by an AlInGaP light-emitting diode with the following characteristics: peak wavelength
λp = 625 nm and spectral halfwidth Δλ½ = 20 nm.
3. The 850 nm irradiance Ee is supplied by a light-emitting diode with the following characteristics: peak wavelength
λp = 850 nm and spectral halfwidth Δλ½ = 42 nm.
4. The integration time Tint, is dependent on internal oscillator frequency (fosc) and on the number of integration cycles (ATIME) in the
Timing Register (0xFF) as described in the Register section. For nominal fosc = 750 kHz, nominal Tint = 2.7 ms
× ATIME.
5. 111
× gain is affected by the line inductance between the V
DD pin and the decoupling capacitor. See Figure 3 for 111
× gain scale
versus line inductance characteristic.



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