28F020

E

28

4.8

AC Characteristics—Read Only Operations—Commercial and Extended

Temperature Products

Versions

Symbol

Characteristics

Notes

Min

Max

Min

Max

Min

Max

Unit

Read Cycle Time

90

120

150

ns

Chip Enable Access

Time

90

120

150

ns

Address Access

Time

90

120

150

ns

Output Enable

Access Time

35

50

50

ns

Chip Enable to

Output in Low Z

2, 3

0

0

0

ns

Chip Disable to

Output in High Z

245

55

55

ns

Output Enable to

Output in Low Z

2, 3

0

0

0

ns

Output Disable to

Output in High Z

230

30

30

ns

Output Hold from

Address, CE#, or

OE# Change

1, 2

0

0

0

ns

Write Recovery Time

before Read

66

6

µs

NOTES:

1.

Whichever occurs first.

2.

Sampled, not 100% tested.

3.

Guaranteed by design.

4.

See

High Speed AC Testing Input/Output Waveform (Figure 8) and High Speed AC Testing Load Circuit (Figure 9) for

testing characteristics.

5.

See

Testing Input/Output Waveform (Figure 6) and AC Testing Load Circuit (Figure 7) for testing characteristics.