BQ76PL536APAPR datasheet(6/74 Pages) TI1

6 / 74 page

bq76PL536A

SLUSAD3B – JUNE 2011 – REVISED JANUARY 2016

www.ti.com

Pin Functions (continued)

TYPE(1)

DESCRIPTION

NAME

NO.

VC6

Sense voltage input terminal for the positive terminal of the sixth cell

Internal analog voltage reference (+), requires 10-µF, low-ESR ceramic capacitor to

VREF

AGND for stability

14, 33, 34,

VSS

VSSD

25, 49

VSS

Thermal pad on bottom of PowerPAD™ package; this must be soldered to similar-size

Thermal pad

–

copper area on PCB and connected to VSS, to meet stated specifications herein.

Provides heat-sinking to part.

(1) Key: I = digital input, AI = analog input, O = digital output, OD = open-drain output, T = 3-state output, P = power.

6 Specifications

6.1 Absolute Maximum Ratings

over operating free-air temperature range (unless otherwise noted)

(1)

MIN

MAX

UNIT

Supply voltage, VMAX

BAT1(2)

–0.3

BAT voltage to any other pin

BAT to any pin

–0.3

VC1, VC2, VC3, VC4, VC5, VC6

–0.3

VC0

–0.3

TS1+, TS1–, TS2+, TS2–

–0.3

Input voltage, VIN

GPAI

–0.3

GPIO

–0.3

VREG50 + 0.3

DRDY_N, SDO_N, FAULT_N, ALERT_N

VBAT – 1

VBAT + 2

CONV_S, SDI_S, SCLK_S, CS_S

–2

CONV_N, SDI_N, SCLK_N, CS_N

–0.3

DRDY_S, SDO_S, FAULT_S, ALERT_S

–0.3

Output voltage, VO

GPIO

–0.3

VREG50 + 0.3

CB1…CB6 (CBREF = 0x00)

–0.3

REG50, AUX

–0.3

Junction temperature, TJ

150

°C

Storage temperature, Tstg

–65

°C

(1)

Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings

only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended

Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

(2)

All voltages are with respect to VSS of this device except where otherwise noted.

6.2 ESD Ratings

VALUE

UNIT

Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1)

±2000

V(ESD)

Electrostatic discharge

Charged-device model (CDM), per JEDEC specification JESD22-C101(2)

±500

(1)

JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.

(2)

JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.

Submit Documentation Feedback

Product Folder Links: bq76PL536A

BQ76PL536APAPR 데이터시트(PDF) 6 Page - Texas Instruments

BQ76PL536APAPR 데이터시트(HTML) 6 Page - Texas Instruments

Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 65 66 67 68 69 70 71 72 73 74

데이터시트 다운로드

링크 URL