STM32F756VG datasheet(139/228 Pages) STMICROELECTRONICS

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STM32F756xx

Electrical characteristics

196

The failure is indicated by an out of range parameter: ADC error above a certain limit (>5

LSB TUE), out of conventional limits of induced leakage current on adjacent pins (out of –

5 µA/+0 µA range), or other functional failure (for example reset, oscillator frequency

deviation).

Negative induced leakage current is caused by negative injection and positive induced

leakage current by positive injection.

The test results are given in Table 55.

Note:

It is recommended to add a Schottky diode (pin to ground) to analog pins which may

potentially inject negative currents.

5.3.17

I/O port characteristics

General input/output characteristics

Unless otherwise specified, the parameters given in Table 56: I/O static characteristics are

derived from tests performed under the conditions summarized in Table 17. All I/Os are

CMOS and TTL compliant.

Table 55. I/O current injection susceptibility(1)

Symbol

Description

Functional susceptibility

Unit

Negative

injection

Positive

injection

IINJ

Injected current on BOOT pin

− 0NA

Injected current on NRST pin

− 0NA

Injected current on PA0, PC0 pins

− 0NA

Injected current on any other FT pin

− 5NA

Injected current on any other pins

− 5+5

1. NA = not applicable

Table 56. I/O static characteristics

Symbol

Parameter

Conditions

Min

Typ

Max

Unit

VIL

FT, TTa and NRST I/O input

low level voltage

1.7 V≤VDD≤3.6 V

0.35VDD − 0.04

(1)

0.3VDD(2)

BOOT I/O input low level

voltage

1.75 V≤VDD ≤3.6 V, –

40 °C≤TA ≤105 °C

0.1VDD+0.1(1)

1.7 V≤VDD ≤3.6 V,

0 °C≤TA ≤105 °C

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