| 전자부품 데이터시트 검색엔진 |
|
TMP93CS40DF 데이터시트(PDF) 46 Page - Toshiba Semiconductor |
|
|
|||||||||||||||||||||||||||||
TMP93CS40DF 데이터시트(HTML) 46 Page - Toshiba Semiconductor |
|
46 / 48 page ![]() Quality and Reliability Assurance / Handling Precautions 030901 QUA-46 2002-02-20 4.6.3 Corrosive Gases Corrosive gases can cause chemical reactions in devices, degrading device characteristics. For example, sulphur-bearing corrosive gases emanating from rubber placed near a device (accompanied by condensation under high-humidity conditions) can corrode a device’s leads. The resulting chemical reaction between leads forms foreign particles which can cause electrical leakage. 4.6.4 Radioactive and Cosmic Rays Most industrial and consumer semiconductor devices are not designed with protection against radioactive and cosmic rays. Devices used in aerospace equipment or in radioactive environments must therefore be shielded. 4.6.5 Strong Electrical and Magnetic Fields Devices exposed to strong magnetic fields can undergo a polarization phenomenon in their plastic material, or within the chip, which gives rise to abnormal symptoms such as impedance changes or increased leakage current. Failures have been reported in LSIs mounted near malfunctioning deflection yokes in TV sets. In such cases, the device’s installation location must be changed or the device must be shielded against the electrical or magnetic field. Shielding against magnetism is especially necessary for devices used in an alternating magnetic field because of the electromotive forces generated in this type of environment. 4.6.6 Interference from Light (ultraviolet rays, sunlight, fluorescent lamps and incandescent lamps) Light striking a semiconductor device generates electromotive force due to photoelectric effects. In some cases the device can malfunction. This is especially true for devices in which the internal chip is exposed. When designing circuits, make sure that devices are protected against incident light from external sources. This problem is not limited to optical semiconductors and EPROMs. All types of device can be affected by light. 4.6.7 Dust and Oil Just like corrosive gases, dust and oil can cause chemical reactions in devices, which will adversely affect a device’s electrical characteristics. To avoid this problem, do not use devices in dusty or oily environments. This is especially important for optical devices because dust and oil can affect a device’s optical characteristics as well as its physical integrity and the electrical performance factors mentioned above. 4.6.8 Fire Semiconductor devices are combustible; they can emit smoke and catch fire if heated sufficiently. When this happens, some devices may generate poisonous gases. Devices should therefore never be used in close proximity to an open flame or a heat-generating body, or near flammable or combustible materials. |
|
링크 URL |
| ALLDATASHEET 가 귀하에 도움이 되셨나요? [ DONATE ] |
Alldatasheet는? | 광고문의 | 운영자에게 연락하기 | 개인정보취급방침 | 링크 투 데이터시트 | 링크교환 | 제조사별 검색 All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |