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PC87311AVF 데이터시트(PDF) 64 Page - National Semiconductor (TI) |
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PC87311AVF 데이터시트(HTML) 64 Page - National Semiconductor (TI) |
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64 / 78 page ![]() 90 Device Description (Continued) 92 AC ELECTRICAL CHARACTERISTICS 921 AC Test Conditions TA e 0 Cto70 C VDD e 50V e g10% LOAD CIRCUIT (Notes 1 2 3) TLF11362 – 15 Note 1 CL e 100 pF includes jig and scope capacitance Note 2 S1 e Open for push-pull outputs S1 e VDD for high impedance to active low and active low to high impedance measurements S1 e GND for high impedance to active high and active high to high impedance measure- ments RL e 10 kX for mP interface pins Note 3 For the FDC Open Drive Interface Pins S1 e VDD and RL e 150X AC TESTING INPUT OUTPUT WAVEFORM TLF11362 – 16 922 Clock Timing Symbol Parameter Min Max Units tCH Clock High Pulse Width 16 ns tCL Clock Low Pulse Width 16 ns tCP Clock Period 40 43 ns tICP Internal Clock Period (Table 9-1) tDRP Data Rate Period (Table 9-1) TABLE 9-1 Nominal tICP tDRP Values MFM Data Rate tDRP tICP Value Units 1 Mbs 1000 3 c tCP 125 ns 500 kbs 2000 3 c tCP 125 ns 300 kbs 3333 5 c tCP 208 ns 250 kbs 4000 6 c tCP 250 ns TLF11362 – 17 FIGURE 9-1 Clock Timing 64 |
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