ST7MC1K2 datasheet(184/371 Pages) STMICROELECTRONICS

184 / 371 page

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The end of demagnetization event (D), is also detected by the MTC or simulated with a timer

compare feature when no detection is possible.

The MTC manages these three events always in the same order: Z generates C after a

delay computed in realtime, then waits for D in order to enable the peripheral to detect

another Z event.

The BEMF zero-crossing event (Z), can also be detected by the MTC or simulated with a

timer compare feature when no detection is possible.

The speed regulation is managed by the microcontroller, by means of an adjustable

reference current level in case of current control, or by direct PWM duty-cycle adjustment in

case of voltage control.

Figure 74.

Chronogram of events (in autoswitched mode)

CH event

ZH or ZS event

Cn processing

Wait for Cn

Wait for Dn

DH event

DS event

Wait for Z

VDD

VSS

P signal when sampled

(output of the analog MUX)

VREF

(threshold value for

Voltage on phase A

Voltage on phase B

Voltage on phase C

Input comparator)

BEMF

sampling

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ST7MC1K2 데이터시트(PDF) 184 Page - STMicroelectronics

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