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STM8L151C2 데이터시트(PDF) 78 Page - STMicroelectronics

부품명 STM8L151C2
상세설명  Reset and supply management
PDF  122 Pages
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STM8L151C2 데이터시트(HTML) 78 Page - STMicroelectronics

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Electrical parameters
STM8L151x2, STM8L151x3
78/122
DocID018780 Rev 9
9.3.5
Memory characteristics
TA = -40 to 125 °C unless otherwise specified.
Flash memory
Table 34. RAM and hardware registers
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
VRM
Data retention mode (1)
1. Minimum supply voltage without losing data stored in RAM (in Halt mode or under Reset) or in hardware
registers (only in Halt mode). Guaranteed by characterization results.
Halt mode (or Reset)
1.65
-
-
V
Table 35. Flash program and data EEPROM memory
Symbol
Parameter
Conditions
Min
Typ
Max
(1)
Unit
VDD
Operating voltage
(all modes, read/write/erase)
fSYSCLK = 16 MHz
1.65
-
3.6
V
tprog
Programming time for 1 or 64 bytes (block)
erase/write cycles (on programmed byte)
--
6
-
ms
Programming time for 1 to 64 bytes (block)
write cycles (on erased byte)
--
3
-
ms
Iprog
Programming/ erasing consumption
TA=+25 °C, VDD = 3.0 V
-
0.7
-
mA
TA=+25 °C, VDD = 1.8 V
-
0.7
-
tRET(2)
Data retention (program memory) after 10000
erase/write cycles at TA= –40 to +85 °C
(3 and 6 suffix)
TRET = +85 °C
30(1)
--
years
Data retention (program memory) after 10000
erase/write cycles at TA= –40 to +125 °C
(3 suffix)
TRET = +125 °C
5(1)
--
Data retention (data memory) after 300000
erase/write cycles at TA= –40 to +85 °C
(3 and 6 suffix)
TRET = +85 °C
30(1)
--
Data retention (data memory) after 300000
erase/write cycles at TA= –40 to +125 °C
(3 suffix)
TRET = +125 °C
5(1)
--
NRW (3)
Erase/write cycles (program memory)
TA = –40 to +85 °C
(3 and 6 suffix),
TA = –40 to +105 °C
(3 suffix) or
TA = –40 to +125 °C
(3 suffix)
10(1)
--
kcycles
Erase/write cycles (data memory)
300(1)
(4)
--
1. Guaranteed by characterization results.
2. Conforming to JEDEC JESD22a117
3. The physical granularity of the memory is 4 bytes, so cycling is performed on 4 bytes even when a write/erase operation
addresses a single byte.
4. Data based on characterization performed on the whole data memory.



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