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STM32F302XD 데이터시트(PDF) 138 Page - STMicroelectronics |
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STM32F302XD 데이터시트(HTML) 138 Page - STMicroelectronics |
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138 / 168 page ![]() Electrical characteristics STM32F302xD STM32F302xE 138/168 DocID026900 Rev 4 Figure 50. ADC accuracy characteristics Table 85. ADC accuracy at 1MSPS(1)(2) Symbol Parameter Test conditions Typ Max(3) Unit ET Total unadjusted error ADC Freq ≤ 72 MHz Sampling Freq ≤ 1MSPS 2.4 V ≤ VDDA = VREF+ ≤ 3.6 V Single-ended mode Fast channel ±2.5 ±5 LSB Slow channel ±3.5 ±5 EO Offset error Fast channel ±1 ±2.5 Slow channel ±1.5 ±2.5 EG Gain error Fast channel ±2 ±3 Slow channel ±3 ±4 ED Differential linearity error Fast channel ±0.7 ±2 Slow channel ±0.7 ±2 EL Integral linearity error Fast channel ±1 ±3 Slow channel ±1.2 ±3 1. ADC DC accuracy values are measured after internal calibration. 2. ADC accuracy vs. negative Injection Current: Injecting negative current on any analog input pins should be avoided as this significantly reduces the accuracy of the conversion being performed on another analog input. It is recommended to add a Schottky diode (pin to ground) to analog pins which may potentially inject negative current. Any positive injection current within the limits specified for IINJ(PIN) and ∑IINJ(PIN) in Section 6.3.15: I/O port characteristics does not affect the ADC accuracy. 3. Data based on characterization results, not tested in production. |
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