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PC7447 데이터시트(PDF) 37 Page - ATMEL Corporation |
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PC7447 데이터시트(HTML) 37 Page - ATMEL Corporation |
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37 / 66 page ![]() 37 PC7457/47 [Preliminary] 5345B–HIREL–02/04 Figure 22. Test Access Port Timing Diagram Note: VM = Midpoint Voltage (OVDD/2) Preparation for Delivery Handling MOS devices must be handled with certain precautions to avoid damage due to accu- mulation of static charge. Input protection devices have been designed in the chip to minimize the effect of static buildup. However, the following handling practices are recommended: • Devices should be handled on benches with conductive and grounded surfaces. • Ground test equipment, tools and operator. • Do not handle devices by the leads. • Store devices in conductive foam or carriers. • Avoid use of plastic, rubber or silk in MOS areas. • Maintain relative humidity above 50% if practical. tJLOX Input Data Valid tIVJH tIXJH tJLOV tJLOZ Output Data Valid Output Data Valid VM TCK TDI, TMS TDO TDO VM |
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