AM79C930VCW datasheet(137/161 Pages) AMD

137 / 161 page

P R E L I M I N A R Y

AMD

137

Am79C930

AC CHARACTERISTICS

5.0 V MEMORY BUS INTERFACE

ABSOLUTE MAXIMUM RATINGS

Storage Temperature:

–65 to +150

°C

. . . . . . . . . . . .

Ambient Temperature Under Bias:

–65 to +125

°C

. . .

Supply Voltage to AVSS

or DVSS (AVDD, DVDD):

–0.3 to +6 V

. . . . . . . . . . . . . .

Stresses above those listed under Absolute Maximum

Ratings may cause permanent device failure. Functionality at

or above these limits is not implied. Exposure to Absolute

Maximum

Ratings

for

extended

periods

may

affect

device reliability.

OPERATING RANGES

Commercial (C) Devices

Temperature (TA)0

°C to + 70°C

. . . . . . . . . . . . . . . . .

Supply Voltages (VCC, VDDT, VDDU1, VDDU2, VDDM, VDDP)

4.75 V to 5.25 V

. . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Supply Voltages

(AVDD, VDD5)

+5 V

± 5%

. . . . . . . . . . . . . . . . . . . . . . . .

All inputs within the range: VSS – 0.5 V

≤ V

+ 0.1 X

VDD – where VSS and VDD are appropriate reference pins

for a given input pin. (See section on power supply

pin descriptions.)

CL = 50 pF unless otherwise noted

Operating ranges define those limits between which the func-

tionality of the device is guaranteed.

MEMORY BUS READ ACCESS

Parameter

Symbol

Parameter Description

Test Conditions

Min

Max

Unit

tmAD

MA[16:0] valid from CLKIN

↓

260

tmCD

CE active delay from CLKIN

↓

Note 1

tmOD

MOE active delay from CLKIN

↓

260

tmOLZ

MOE

↓ to MD[7:0] driven

0 wait states

(Note 3)

1 wait state

2 wait states

130

tmAA

Address Read Access Time

0 wait states

(Note 3)

1 wait state

105

2 wait states

155

tmACS

CE Read Access Time

0 wait states

(Notes 1, 3)

1 wait state

105

2 wait states

155

tmOE

MOE Read Access Time

0 wait states

(Note 3)

1 wait state

2 wait states

130

tmRI

CE Inactive Time

Notes 1, 2

tmAH

MA[16:0] valid hold from

MOE

↑

Note 1

TCLKIN-10

tmCH

CE valid hold from MOE

↑

TCLKIN-10

tmH

MD[7:0] valid hold from

MOE

↑

Note 2

tmHZ

MD[7:0] inactive from

MOE

↑

Note 2

2 X TCLKIN-15

Notes:

CE = one of: FCE, SCE, XCE

2. Parameter not included in the production test.

3. Value is dependent upon TCLKIN value. Value given is for CLKIN = 40 MHz.

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