STM32WLE4JC datasheet(106/145 Pages) STMICROELECTRONICS

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Electrical characteristics

STM32WLE5/E4xx

106/145

DS13105 Rev 8

Designing hardened software to avoid noise problems

EMC characterization and optimization are performed at component level with a typical

application environment and simplified MCU software.

Note:

Good EMC performance is highly dependent on the user application and the software in

particular.It is then recommended that the user applies EMC software optimization and

prequalification tests in relation with the EMC level requested for the application.

Software recommendations

The software flow must include the management of runaway conditions such as:

•

corrupted program counter

•

unexpected reset

•

critical data corruption (control registers)

Prequalification trials

Most of the common failures (unexpected reset and program counter corruption) can be

reproduced by manually forcing a low state on the NRST pin or the oscillator pins for 1 s.

To complete these trials, ESD stress can be applied directly on the device, over the range of

specification values. When unexpected behavior is detected, the software can be hardened

to prevent unrecoverable errors occurring. For more details, refer to the application note

Software techniques for improving microcontrollers EMC performance (AN1015).

Electromagnetic interference (EMI)

The electromagnetic field emitted by the device is monitored while a simple application is

executed (toggling two LEDs through the I/O ports). This emission test is compliant with the

IEC 61967-2 standard, that specifies the test board and the pin loading.

Table 67. EMS characteristics

Symbol

Parameter

Conditions

Level/Class

VFESD

Voltage limits to be applied on any I/O pin to

induce a functional disturbance

VDD = 3.3 V, TA = +25 °C, fHCLK = 48 MHz,

conforming to IEC 61000-4-2

VEFTB

Fast transient voltage burst limits to be

applied through 100 pF on VDD and VSS

pins to induce a functional disturbance

VDD = 3.3 V, TA = +25 °C, fHCLK = 48 MHz,

conforming to IEC 61000-4-4

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