STM32WLE4JC datasheet(108/145 Pages) STMICROELECTRONICS

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Electrical characteristics

STM32WLE5/E4xx

108/145

DS13105 Rev 8

5.3.15

I/O current injection characteristics

As a general rule, current injection to the I/O pins, due to external voltage below VSS or

above VDD (for standard, 3V-capable I/O pins), must be avoided during normal product

operation. However, in order to give an indication of the robustness of the microcontroller in

case abnormal injection accidentally happens, susceptibility tests are performed on a

sample basis during device characterization.

Functional susceptibility to I/O current injection

While a simple application is executed on the device, the device is stressed by injecting

current into the I/O pins programmed in floating-input mode. While current is injected into

the I/O pin, one at a time, the device is checked for functional failures.

The failure is indicated by an out-of-range parameter: ADC error above a certain limit

(higher than 5 LSB TUE), out of conventional limits of induced leakage current on adjacent

pins (out of the -5 µA/0 µA range) or other functional failure (for example reset occurrence

or oscillator frequency deviation).

The characterization results are given in the table below.

Negative induced leakage current is caused by negative injection and positive induced

leakage current is caused by positive injection.

Table 71. I/O current injection susceptibility(1)

1. Guaranteed by characterization results.

Symbol

Description

Functional susceptibility

Unit

Negative

injection

Positive

injection

IINJ

Injected current on all pins except PB0

–5

N/A(2)

2. Injection not possible.

Injected current on PB0 pin

–5

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