MCP960X datasheet(4/57 Pages) MICROCHIP

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DS20005426G-page 4

MCP960X/L0X/RL0X

Thermocouple Sensor Measurement Accuracy – MCP96L00/L01

TH Hot-Junction Accuracy (VDD =3.3V)

TH =TC +TΔ (Note 1)

TH_ACY

-4.0

±2

+4.0

°C

TA = 0°C to +85°C

-6.0

±4

+6.0

TA = -40°C to +125°C

TC Cold-Junction Accuracy (VDD =3.3V)

TC_ACY

-1.0

±0.5

+1.0

°C

TA = 0°C to +85°C

-2.0

±1

+2.0

TA = -40°C to +125°C

TΔ Junctions Temperature Delta Accuracy – MCP96L00/L01

Type K: TΔ = -200°C to +1372°C

VEMF Range: -5.907 mV to 54.886 mV

TΔ_ACY

-3.0

±1.5

+3.0

°C

TA = 0°C to +85°C,

VDD =3.3V (Note 2)

Type J: TΔ = -150°C to +1200°C

VEMF Range: -3.336 mV to 47.476 mV

Type T: TΔ = -200°C to +400°C

VEMF Range: -5.603 mV to 20.81 mV

Type N: TΔ = -150°C to +1300°C

VEMF Range: -3.336 mV to 47.476 mV

Type E: TΔ = -200°C to +1000°C

VEMF Range: -8.825 mV to 76.298 mV

Type S: TΔ = 250°C to +1664°C

VEMF Range: -1.875 mV to 17.529 mV

TA = 0°C to +85°C

VDD =3.3V

(Notes 2, 3)

Type B: TΔ = 1000°C to +1800°C

VEMF Range: -4.834 mV to 13.591 mV

Type R: TΔ = 250°C to +1664°C

VEMF Range: -1.923 mV to 19.732 mV

DC CHARACTERISTICS (CONTINUED)

Electrical Specifications: Unless otherwise indicated, VDD = 2.7V to 5.5V, GND = Ground, TA = -40°C to +125°C

(where: TA =TC, defined as Device Ambient Temperature).

Parameters

Sym.

Min.

Typ.

Max.

Unit

Conditions

Note 1:

The TC and T summation is implemented in milli-volt (mV) domain. The result, TH (mV), is converted to

Degree Celsius using the NIST ITS-90 Conversion database.

The T_ACY temperature accuracy specification is defined as the device accuracy to the NIST ITS-90

Thermocouple EMF to Degree Celsius Conversion Database with TC = 0°C.

The device measures temperature below the specified range, however, the sensitivity to changes in

temperature reduces exponentially. Type R and S measure down to -50°C, or -0.226 mVEMF and

-0.235 mVEMF, respectively. Type B measures down to 500°C or 1.242 mVEMF (see

Figures 2-7, 2-8, 2-10, 2-11, 2-14 and 2-17).

Exceeding the VIN_CM input range may cause leakage current through the ESD protection diodes at the

thermocouple input pins. This parameter is characterized but not production tested.

The Minimum and Maximum %VDD thresholds are characterized but not production tested.

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