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전자부품 데이터시트 검색엔진 |
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전자부품 데이터시트 검색엔진 |
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LXT386LE 데이터시트(PDF) 46 Page - Intel Corporation |
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LXT386LE 데이터시트(HTML) 46 Page - Intel Corporation |
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46 / 78 page  LXT386 — QUAD T1/E1/J1 Transceiver 46 Datasheet Table 30. TAP State Description State Description Test Logic Reset In this state the test logic is disabled. The device is set to normal operation mode. While in this state, the instruction register is set to the ICODE instruction. Run -Test/Idle The TAP controller stays in this state as long as TMS is low. Used to perform tests. Capture - DR The Boundary Scan Data Register (BSR) is loaded with input pin data. Shift - DR Shifts the selected test data registers by one stage tword its serial output. Update - DR Data is latched into the parallel output of the BSR when selected. Capture - IR Used to load the instruction register with a fixed instruction. Shift - IR Shifts the instruction register by one stage. Update - IR Loads a new instruction into the instruction register. Pause - IR Pause - DR Momentarily pauses shifting of data through the data/instruction registers. Exit1 - IR Exit1 - DR Exit2 - IR Exit2 - DR Temporary states that can be used to terminate the scanning process. |
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