LTC2414IGN datasheet(28/48 Pages) LINER

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LTC2414/LTC2418

241418fa

RSOURCE (Ω)

0 100 200 300 400 500 600 700 800 900 1000

2414/18 F15

300

240

180

120

VCC = 5V

REF+ = 5V

REF – = GND

IN+ = 3.75V

IN– = 1.25V

FO = GND

TA = 25°C

CIN = 0.01µF

CIN = 0.1µF

CIN = 1µF, 10µF

RSOURCE (Ω)

0 100 200 300 400 500 600 700 800 900 1000

2414/18 F16

–60

–120

–180

–240

–300

VCC = 5V

REF+ = 5V

REF – = GND

IN+ = 1.25V

IN– = 3.75V

FO = GND

TA = 25°C

CIN = 0.01µF

CIN = 0.1µF

CIN = 1µF, 10µF

VINCM (V)

0.5

1.5

2.5

3.5

4.5

2414/18 F17

120

100

–20

–40

–60

–80

–100

–120

FO = GND

TA = 25°C

RSOURCEIN– = 500Ω

CIN = 10µF

VCC = 5V

REF+ = 5V

REF – = GND

IN+ = IN– = VINCM

∆RIN = +400Ω

∆RIN = +200Ω

∆RIN = +100Ω

∆RIN = 0Ω

∆RIN = –100Ω

∆RIN = –200Ω

∆RIN = –400Ω

Figure 15. +FS Error vs RSOURCE at IN+ or IN– (Large CIN)

Figure 16. –FS Error vs RSOURCE at IN

+ or IN– (Large CIN)

Figure 17. Offset Error vs Common Mode Voltage

(VINCM = IN+ = IN–) and Input Source Resistance Imbalance

(

∆RIN = RSOURCEIN+ – RSOURCEIN–) for Large CIN Values (CIN ≥ 1µF)

APPLICATIO S I FOR ATIO

1.78 • 10–6 • fEOSCppm. Figure 17 shows the typical offset

error due to input common mode voltage for various

values of source resistance imbalance between the IN+

and IN– pins when large CIN values are used.

If possible, it is desirable to operate with the input signal

common mode voltage very close to the reference signal

common mode voltage as is the case in the ratiometric

measurement of a symmetric bridge. This configuration

eliminates the offset error caused by mismatched source

impedances.

The magnitude of the dynamic input current depends upon

the size of the very stable internal sampling capacitors and

upon the accuracy of the converter sampling clock. The

accuracy of the internal clock over the entire temperature

and power supply range is typical better than 0.5%. Such

a specification can also be easily achieved by an external

clock. When relatively stable resistors (50ppm/

°C) are

used for the external source impedance seen by IN+ and

IN–, the expected drift of the dynamic current, offset and

gain errors will be insignificant (about 1% of their respec-

tive values over the entire temperature and voltage range).

Even for the most stringent applications, a one-time

calibration operation may be sufficient.

In addition to the input sampling charge, the input ESD

protection diodes have a temperature dependent leakage

current. This current, nominally 1nA (

±10nA max), results

in a small offset shift. A 100

Ω source resistance will create

a 0.1

µV typical and 1µV maximum offset voltage.

Reference Current

In a similar fashion, the LTC2414/LTC2418 samples the

differential reference pins REF+ and REF– transferring

small amount of charge to and from the external driving

circuits thus producing a dynamic reference current. This

current does not change the converter offset, but it may

degrade the gain and INL performance. The effect of this

current can be analyzed in the same two distinct situa-

tions.

For relatively small values of the external reference capaci-

tors (CREF < 0.01µF), the voltage on the sampling capacitor

settles almost completely and relatively large values for

the source impedance result in only small errors. Such

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