| 전자부품 데이터시트 검색엔진 |
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DIM2400ESS12 데이터시트(PDF) 2 Page - Dynex Semiconductor |
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DIM2400ESS12 데이터시트(HTML) 2 Page - Dynex Semiconductor |
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2 / 9 page ![]() SEMICONDUCTOR DIM2400ESS12-A000 Caution: This device is sensitive to electrostatic discharge. Users should follow ESD handling procedures 2/9 www.dynexsemi.com ABSOLUTE MAXIMUM RATINGS Stresses above those listed under ‘Absolute Maximum Ratings’ may cause permanent damage to the device. In extreme conditions, as with all semiconductors, this may include potentially hazardous rupture of the package. Appropriate safety precautions should always be followed. Exposure to Absolute Maximum Ratings may affect device reliability. Tcase = 25° C unless stated otherwise Symbol Parameter Test Conditions Max. Units VCES Collector-emitter voltage VGE = 0V 1200 V VGES Gate-emitter voltage ±20 V IC Continuous collector current Tcase = 85° C 2400 A IC(PK) Peak collector current 1ms, Tcase =115° C 4800 A Pmax Max. transistor power dissipation Tcase = 25° C, Tj = 150° C 20830 kW I 2t Diode I 2t value (IGBT arm) VR = 0, tP = 10ms, Tvj = 125° C 900 kA 2S Visol Isolation voltage – per module Commoned terminals to base plate. AC RMS, 1 min, 50Hz 2500 V |
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