| 전자부품 데이터시트 검색엔진 |
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DIM2400ESS12 데이터시트(PDF) 3 Page - Dynex Semiconductor |
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DIM2400ESS12 데이터시트(HTML) 3 Page - Dynex Semiconductor |
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3 / 9 page ![]() SEMICONDUCTOR DIM2400ESS12-A000 Caution: This device is sensitive to electrostatic discharge. Users should follow ESD handling procedures 3/9 www.dynexsemi.com THERMAL AND MECHANICAL RATINGS Internal insulation material: Al2O3 Baseplate material: Copper Creepage distance: 32mm Clearance: 20mm CTI (Critical Tracking Index): 175 Symbol Parameter Test Conditions Min. Typ. Max. Units Rth(j-c) Thermal resistance – transistor Continuous dissipation – junction to case - - 6 ° C/kW Rth(j-c) Thermal resistance – diode Continuous dissipation – junction to case - - 13.3 ° C/kW Rth(c-h) Thermal resistance – case to heatsink (per module) Mounting torque 5Nm (with mounting grease) - - 6 ° C/kW Tj Junction temperature Transistor - - 150 ° C Diode - - 125 ° C Tstg Storage temperature range - -40 - 125 ° C - Screw torque Mounting – M6 - - 5 Nm Electrical connections – M4 - - 2 Nm Electrical connections – M8 - - 10 Nm |
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