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CLRC63201T/0FE 데이터시트(PDF) 67 Page - NXP Semiconductors |
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CLRC63201T/0FE 데이터시트(HTML) 67 Page - NXP Semiconductors |
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67 / 163 page ![]() Philips Semiconductors Product Specification Rev. 3.0; May 2003 Multiple Protocol Contactless Reader IC CL RC632 67 Confidential 5.2.8.6 TestDigiSelect Register Selects digital test mode. Name: TestDigiSelect Address:0x3D Reset value: xxxxxxxx, 0xxx 7 6 5 4 3 2 1 0 SignalTo MFOUT TestDigiSignalSel Access Rights w w w w w w w w Description of the bits Bit Symbol Function 7 SignalToMFOUT Set to 1, overrules the setting in MFOUTSelect and the digital test signal defined in TestDigiSignalSel is routed to pin MFOUT instead. Set to 0, MFOUTSelect defines the signal delivered at pin MFOUT. Selects the digital test signal to be routed to pin MFOUT. For detailed information refer to chapter 21.4 TestDigiSignalSel Signal Name 6-0 TestDigiSignalSel F4hex E4hex D4hex C4hex B5hex A5hex 96hex 83hex E2hex s_data s_valid s_coll s_clock rd_sync wr_sync int_clock BPSK_out BPSK_sig 5.2.8.7 RFU Registers Name: RFU Address: 0x3E, 0x3F Reset value: xxxxxxxx, 0xxx 7 6 5 4 3 2 1 0 x x x x x x x x Access Rights w w w w w w w w Note: These registers are reserved for future use. |
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