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CLRC63201T/0FE 데이터시트(PDF) 145 Page - NXP Semiconductors

부품명 CLRC63201T/0FE
상세설명  Multiple Protocol Contactless Reader IC
PDF  163 Pages
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제조업체  PHILIPS [NXP Semiconductors]
홈페이지  http://www.nxp.com
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CLRC63201T/0FE 데이터시트(HTML) 145 Page - NXP Semiconductors

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Philips Semiconductors
Product Specification Rev. 3.0; May 2003
Multiple Protocol Contactless Reader IC
CL RC632
145
Confidential
21.3 Analog Test-Signals
The analog test signals may be routed to pin AUX by selecting them with the register bits TestAnaOutSel.
Value
Signal Name
Description
0
Vmid
Voltage at internal node Vmid
1
Vbandgap
Internal reference voltage generated by the band gap.
2
VRxFollI
Output signal from the demodulator using the I-clock.
3
VRxFollQ
Output signal from the demodulator using the Q-clock.
4
VRxAmpI
I-channel subcarrier signal amplified and filtered.
5
VRxAmpQ
Q-channel subcarrier signal amplified and filtered.
6
VCorrNI
Output signal of N-channel correlator fed by the I-channel subcarrier
signal.
7
VCorrNQ
Output signal of N-channel correlator fed by the Q-channel subcarrier
signal.
8
VCorrDI
Output signal of D-channel correlator fed by the I-channel subcarrier
signal.
9
VCorrDQ
Output signal of D-channel correlator fed by the Q-channel subcarrier
signal.
A
VEvalL
Evaluation signal from the left half bit.
B
VEvalR
Evaluation signal from the right half bit.
C
VTemp
Temperature voltage derived from band gap.
D
rfu
Reserved for future use
E
rfu
Reserved for future use
F
rfu
Reserved for future use
Table 21-2: Analog Test Signal Selection



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