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TLC320AD50C/I 데이터시트(PDF) 37 Page - Texas Instruments |
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TLC320AD50C/I 데이터시트(HTML) 37 Page - Texas Instruments |
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37 / 54 page ![]() 4–4 4.3.7 DAC Dynamic Performance 4.3.7.1 DAC Signal-to-Noise When Load is 600 Ω (see Note 7 and Figure 5-13) PARAMETER TEST CONDITIONS TLC320AD50C/52C TLC320AD50I UNIT PARAMETER TEST CONDITIONS MIN TYP MAX MIN TYP MAX UNIT VI = 0 dB 85 89 83 87 Signal to noise ratio (SNR) VI = – 9 dB 76 80 74 78 dB Signal-to-noise ratio (SNR) VI = – 40 dB 45 49 43 47 dB VI = – 65 dB 20 24 18 22 NOTE 7: The test condition is the digital equivalent of a 1020-Hz input signal with an 8-kHz conversion rate. The test is measured at output of application schematic low-pass filter. The test is conducted in 16-bit mode. 4.3.7.2 DAC Signal-to-Noise When Load is 10 k Ω (see Note 7) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT VI = 0 dB 89 Signal to noise ratio (SNR) VI = – 9 dB 80 dB Signal-to-noise ratio (SNR) VI = – 40 dB 50 dB VI = – 65 dB 25 NOTE 7: The test condition is the digital equivalent of a 1020-Hz input signal with an 8-kHz conversion rate. The test is measured at output of application schematic low-pass filter. The test is conducted in 16-bit mode. 4.3.7.3 DAC Signal-to- Distortion When Load is 600 Ω (see Note 7, Figure 5-14) PARAMETER TEST CONDITIONS TLC320AD50C/52C TLC320AD50I UNIT PARAMETER TEST CONDITIONS MIN TYP MAX MIN TYP MAX UNIT VI = – 3 dB 76 80 74 78 Signal to total harmonic distortion (THD) VI = – 9 dB 84 90 82 88 dB Signal-to-total harmonic distortion (THD) VI = – 40 dB 64 72 62 70 dB VI = – 65 dB 42 48 40 46 NOTE 7: The test condition is the digital equivalent of a 1020-Hz input signal with an 8-kHz conversion rate. The test is measured at output of application schematic low-pass filter. The test is conducted in 16-bit mode. 4.3.7.4 DAC Signal-to- Distortion When Load is 10 k Ω (see Note 7) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT VI = – 3 dB 82 Signal to total harmonic distortion (THD) VI = – 9 dB 91 dB Signal-to-total harmonic distortion (THD) VI = – 40 dB 77 dB VI = – 65 dB 49 NOTE 7: The test condition is the digital equivalent of a 1020-Hz input signal with an 8-kHz conversion rate. The test is measured at output of application schematic low-pass filter. The test is conducted in 16-bit mode. 4.3.7.5 DAC Signal-to-Distortion+Noise When Load is 600 Ω (see Note 7, Figure 5-15) PARAMETER TEST CONDITIONS TLC320AD50C/52C TLC320AD50I UNIT PARAMETER TEST CONDITIONS MIN TYP MAX MIN TYP MAX UNIT VI = – 3 dB 75 79 72 76 Signal to total harmonic distortion + noise (THD + N) VI = – 9 dB 75 79 72 76 dB Signal-to-total harmonic distortion + noise (THD + N) VI = – 40 dB 45 49 42 46 dB VI = – 65 dB 20 24 17 21 NOTE 7: The test condition is the digital equivalent of a 1020-Hz input signal with an 8-kHz conversion rate. The test is measured at output of application schematic low-pass filter. The test is conducted in 16-bit mode. |
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