8.6 Electrostatic Discharge Caution

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled

with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may

be more susceptible to damage because very small parametric changes could cause the device not to meet its published

specifications.

8.7 Glossary

TI Glossary

This glossary lists and explains terms, acronyms, and definitions.

9 Revision History

NOTE: Page numbers for previous revisions may differ from page numbers in the current version.

Changes from Revision A (April 2015) to Revision B (August 2024)

Page

• Updated the numbering format for tables, figures, and cross-references throughout the document................. 1

• Updated open-loop gain load condition in Features ..........................................................................................1

• Deleted PDIP package option for quad version device...................................................................................... 1

• Updated Device Information table...................................................................................................................... 1

• Changed W to Ω symbol in front-page figure (typo) .......................................................................................... 1

• Updated Pin Configuration and Functions format...............................................................................................3

• Changed OPA134 pin 1 and 8 from "Offset Trim" to "NC"..................................................................................3

• Changed input voltage from (V–) – 0.7V to (V+) + 0.7V to (V–) – 0.5V to (V+) + 0.5V in Absolute Maximum

Ratings .............................................................................................................................................................. 5

• Added input current and related footnote to Absolute Maximum Ratings ......................................................... 5

• Added Thermal Information ............................................................................................................................... 6

• Updated format of Electrical Characteristics ..................................................................................................... 7

• Updated nominal conditions in the header of Electrical Characteristics ............................................................7

• Changed headroom from 23.6dB to 21.3dB.......................................................................................................7

• Deleted slew rate MIN........................................................................................................................................ 7

• Changed overload recovery time from 0.5µs to 0.6µs........................................................................................7

• Changed input offset voltage MIN from ±0.5mV to ±1mV and MAX from ±2mV to ±3.5mV.............................. 7

• Deleted input offset voltage over temperature MAX...........................................................................................7

• Changed channel separation from 135dB to 128dB for dc, and from 130dB to 126dB for f = 20kHz ...............7

• Deleted note 3.................................................................................................................................................... 7

• Added ± to input bias current TYP......................................................................................................................7

• Changed common-mode voltage MAX value from (V+) – 2.5V to (V+) – 3.5V.................................................. 7

• Updated common-mode rejection ratio and common-mode input impedance test conditions........................... 7

• Changed differential input impedance from 1013Ω || 2pF to 1013Ω || 8pF.......................................................... 7

• Changed common-mode input impedance from 1013Ω || 5pF to 1013Ω || 6pF...................................................7

• Deleted open-loop voltage gain for RL = 600Ω...................................................................................................7

• Deleted voltage output for RL = 600Ω................................................................................................................ 7

• Moved voltage output negative MIN values to MAX values............................................................................... 7

• Deleted output current........................................................................................................................................ 7

• Deleted note 1 from Electrical Characteristics ...................................................................................................7

• Changed typos in typical characteristic graphs; corrected ohms symbol (Ω) and radical symbol (√)................ 9

• Changed test condition for Typical Characteristics from VS = 15V to VS = ±15V (typo).....................................9

• Changed Figure 26, Small-Signal Overshoot vs Load Capacitance into new Figures 5-23 and 5-24................9

• Deleted old Figure 20, Output Voltage Swing vs Output Current, Figure 21, Offset Voltage Production

Distribution, Figure 22, Offset Voltage Drift Production Distribution ..................................................................9

• Updated Functional Block Diagram ................................................................................................................. 15

• Updated Offset Voltage Trim ........................................................................................................................... 16

• Updated OPA134 Layout Example for the Noninverting Configuration ........................................................... 19

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OPA134, OPA2134, OPA4134

SBOS058B – DECEMBER 1997 – REVISED NOVEMBER 2024

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