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R7KA8M2AFDCAM 데이터시트(PDF) 254 Page - Renesas Technology Corp |
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R7KA8M2AFDCAM 데이터시트(HTML) 254 Page - Renesas Technology Corp |
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254 / 295 page ![]() Note 1. Test conditions: 0.2% to 99.8% of the analog input voltage range. Note 2. DNL is measured using the Histogram Method, so the lower limit value is -1. Note 3. This value is based on a 12-bit resolution. Table 2.102 A/D conversion characteristics (Hybrid mode) Conditions: AVCC: 2.7 to 3.63 V, VCC: 2.7 to 3.63 V, VREFH0/VREFH: 2.7 V to AVCC Parameter Min Typ Max Unit Test conditions Hybrid mode Without channel dedicated sample and hold circuits Single- ended input High-speed channels (AN000 to AN005) (AN006 to AN011) Offset error *4 — ±0.5 ±4 LSB ● ADCLK: 50 MHz ● Sampling time: 8 ADCLK ● Successive approximation time: 5 ADCLK ● Signal source impedance: 50 Ω or less ● Digital filter: Sinc filter Gain error *4 — ±1 ±5 LSB DNL differential nonlinearity error*2 *3 — -1 to +1.5 -1 to +2.5 LSB INL integral nonlinearity error*2 — ±4 ±8 LSB Middle-speed channels (AN012 to AN015) *1 Offset error *4 — ±0.5 ±4 LSB ● ADCLK: 50 MHz ● Sampling time: 22 ADCLK ● Successive approximation time: 5 ADCLK ● Signal source impedance: 50 Ω or less ● Digital filter: Sinc filter Gain error *4 — ±1 ±5 LSB DNL differential nonlinearity error*2 *3 — -1 to +2 -1 to +4 LSB INL integral nonlinearity error*2 — ±4 ±8 LSB Low-speed channels (AN016 to AN022) *1 Offset error *4 — ±0.5 ±4 LSB ● ADCLK: 50 MHz ● Sampling time: 42 ADCLK ● Successive approximation time: 5 ADCLK ● Signal source impedance: 50 Ω or less ● Digital filter: Sinc filter Gain error *4 — ±1 ±5 LSB DNL differential nonlinearity error*2*3 — -1 to +2 -1 to +4 LSB INL integral nonlinearity error*2 — ±4 ±12 LSB Differenti al input High-speed channels (AN000 to AN005) (AN006 to AN011) Offset error *4 — ±0.25 ±2 LSB ● ADCLK: 50 MHz ● Sampling time: 8 ADCLK ● Successive approximation time: 5 ADCLK ● Signal source impedance: 50 Ω or less ● Digital filter: Sinc filter Gain error *4 — ±0.5 ±2.5 LSB DNL differential nonlinearity error*2 *3 — -1 to +1.5 -1 to +2 LSB INL integral nonlinearity error*2 — ±3 ±6 LSB With channel dedicated sample and hold circuits Single- ended input High-speed channels (AN000 to AN005) (AN006 to AN011) Offset error *4 — ±0.5 ±4 LSB ● ADCLK: 50 MHz ● Sampling time of channel- dedicated sample-and-hold circuits: * ADCLK ● Hold mode switching time of channel dedicated sample-and- hold circuits: * ADCLK ● Sampling time: * ADCLK ● Successive approximation time: * ADCLK ● Signal source impedance: 50 Ω or less ● Digital filter: Sinc filter Gain error *4 — ±0.5 ±4 LSB DNL differential nonlinearity error*2 *3 — ±1 -1 to +2 LSB INL integral nonlinearity error*2 — ±12 ±16 LSB Differenti al input High-speed channels (AN000 to AN005) (AN006 to AN011) Offset error *4 — ±0.5 ±4 LSB ● ADCLK: 50 MHz ● Sampling time of channel- dedicated sample-and-hold circuits: * ADCLK ● Hold mode switching time of channel dedicated sample-and- hold circuits: * ADCLK ● Sampling time: * ADCLK ● Successive approximation time: * ADCLK ● Signal source impedance: 50 Ω or less ● Digital filter: Sinc filter Gain error *4 — ±0.5 ±4 LSB DNL differential nonlinearity error*2 *3 — ±1 -1 to +2 LSB INL integral nonlinearity error*2 — ±4 ±16 LSB RA8M2 Datasheet 2. Electrical Characteristics R01DS0438EJ0130 Rev.1.30 Feb 27, 2026 Page 254 of 295 |
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