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R7KA8M2AFDCAM 데이터시트(PDF) 255 Page - Renesas Technology Corp |
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R7KA8M2AFDCAM 데이터시트(HTML) 255 Page - Renesas Technology Corp |
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255 / 295 page ![]() Note: These specification values are applicable when only one ADC16H is operating, DAC12 and ACMPHS are not operating, and there is no access to the external bus during A/D conversion. If other ADC unit, DAC12, or ACMPHS is operating or bus access occurs during A/D conversion, values might not fall within the indicated ranges. The use of ports 0 as digital outputs is not allowed when the ADC16H is used. The characteristics apply when AVCC0, AVSS0, VREFH0, VREFH, VREFL0, VREFL, and ADC16H input voltage is stable. Note 1. Channel-dedicated sample-and-hold circuits are not available in these channels. Note 2. Test conditions: 0.2% to 99.8% of the analog input voltage range. Note 3. DNL is measured using the Histogram Method, so the lower limit value is -1. Note 4. This value is based on a 12-bit resolution. Table 2.103 A/D conversion characteristics (Hybrid mode) Conditions: AVCC: 1.62 to 2.7 V, VCC: 1.62 to 2.7 V, VREFH0/VREFH: 1.62 V to AVCC Parameter Min Typ Max Unit Test conditions Hybrid mode Without channel dedicated sample and hold circuits Single- ended input High-speed channels (AN000 to AN005) (AN006 to AN011) Offset error *3 — ±0.5 ±4 LSB ● ADCLK: 50 MHz ● Sampling time: 40 ADCLK ● Successive approximation time: 10 ADCLK ● Signal source impedance: 50 Ω or less ● Digital filter: Sinc filter Gain error *3 — ±1 ±5 LSB DNL differential nonlinearity error*1 *2 — -1 to +2 -1 to +2.5 LSB INL integral nonlinearity error*1 — ±4 ±8 LSB Middle-speed channels (AN012 to AN015) Offset error *3 — ±0.5 ±4 LSB ● ADCLK: 50 MHz ● Sampling time: 60 ADCLK ● Successive approximation time: 10 ADCLK ● Signal source impedance: 50 Ω or less ● Digital filter: Sinc filter Gain error *3 — ±1 ±5 LSB DNL differential nonlinearity error*1 *2 — -1 to +2 -1 to +4 LSB INL integral nonlinearity error*1 — ±4 ±8 LSB Low-speed channels (AN016 to AN022) Offset error *3 — ±0.5 ±4 LSB ● ADCLK: 50 MHz ● Sampling time: 84 ADCLK ● Successive approximation time: 10 ADCLK ● Signal source impedance: 50 Ω or less ● Digital filter: Sinc filter Gain error*3 — ±1 ±5 LSB DNL differential nonlinearity error*1 *2 — -1 to +2 -1 to +4 LSB INL integral nonlinearity error*1 — ±4 ±12 LSB Differenti al input High-speed channels (AN000 to AN005) (AN006 to AN011) Offset error *3 — ±0.25 ±2 LSB ● ADCLK: 50 MHz ● Sampling time: 40 ADCLK ● Successive approximation time: 10 ADCLK ● Signal source impedance: 50 Ω or less ● Digital filter: Sinc filter Gain error *3 — ±0.5 ±2.5 LSB DNL differential nonlinearity error*1 *2 — -1 to +2 -1 to +2.5 LSB INL integral nonlinearity error*1 — ±3 ±6 LSB Note: These specification values are applicable when only one ADC16H is operating, DAC12 and ACMPHS are not operating, and there is no access to the external bus during A/D conversion. If other ADC unit, DAC12, or ACMPHS is operating or bus access occurs during A/D conversion, values might not fall within the indicated ranges. The use of ports 0 as digital outputs is not allowed when the ADC16H is used. The characteristics apply when AVCC0, AVSS0, VREFH0, VREFH, VREFL0, VREFL, and ADC16H input voltage is stable. Note 1. Test conditions: 0.2% to 99.8% of the analog input voltage range. Note 2. DNL is measured using the Histogram Method, so the lower limit value is -1. Note 3. This value is based on a 12-bit resolution. Table 2.104 A/D internal reference voltage characteristics (1 of 2) Parameter Min Typ Max Unit Test conditions A/D internal reference voltage 0.77 0.8 0.84 V — RA8M2 Datasheet 2. Electrical Characteristics R01DS0438EJ0130 Rev.1.30 Feb 27, 2026 Page 255 of 295 |
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