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SPC564L54L5 데이터시트(PDF) 32 Page - STMicroelectronics |
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SPC564L54L5 데이터시트(HTML) 32 Page - STMicroelectronics |
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32 / 160 page ![]() Introduction SPC56XL60/54 32/160 Doc ID 15457 Rev 8 1.5.41 Built-In Self-Test (BIST) capability This device includes the following protection against latent faults: ● Boot-time Memory Built-In Self-Test (MBIST) ● Boot-time scan-based Logic Built-In Self-Test (LBIST) ● Run-time ADC Built-In Self-Test (BIST) ● Run-time Built-In Self Test of LVDs |
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