| 전자부품 데이터시트 검색엔진 |
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CXR702F080 데이터시트(PDF) 9 Page - Sony Corporation |
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CXR702F080 데이터시트(HTML) 9 Page - Sony Corporation |
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9 / 32 page ![]() – 9 – CXR702F080 Symbol TMS TRST TCK RTCK TDO XOUT/CKO RST PWE NC AVDD AVREF AVSS VDD VSS I/O Input Input Input Output Output Output / Output I/O Input Input Functions Test mode control input for JTAG boundary scanning test. Reset input for JTAG boundary scanning test. Clock input for JTAG boundary scanning test. Clock output for JTAG boundary scanning test. Data output for JTAG boundary scanning test. Oscillation connector of main oscillation. (When a clock is supplied externally, input it to EXTAL; opposite phase clock should be input to XTAL.) Main oscillation output. Oscillation connector of main oscillation. (When a clock is supplied externally, input it to TEX; opposite phase clock should be input to TX.) System reset. FLASH EEPROM miswriting protection signal input. NC. (Leave this pin open or connect to Vss.) Positive power supply for A/D converter. Reference voltage input for A/D converter. GND for A/D converter. Positive power supply (Connect all twelve VDD pins to positive power supply.) GND (Connect all twelve Vss pins to GND) System clock output. EXTAL XTAL Input Output TEX TX Input Output |
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