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PXR40 데이터시트(PDF) 79 Page - Freescale Semiconductor, Inc |
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PXR40 데이터시트(HTML) 79 Page - Freescale Semiconductor, Inc |
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79 / 100 page ![]() Electrical characteristics PXR40 Microcontroller Data Sheet, Rev. 1 Freescale Semiconductor 79 Figure 13. JTAG test clock input timing 7 TCK Low to TDO Data Invalid tTDOI 0— ns 8 TCK Low to TDO High Impedance tTDOHZ —20 ns 9 JCOMP Assertion Time tJCMPPW 100 — ns 10 JCOMP Setup Time to TCK Low tJCMPS 40 — ns 11 TCK Falling Edge to Output Valid tBSDV —50 ns 12 TCK Falling Edge to Output Valid out of High Impedance tBSDVZ —50 ns 13 TCK Falling Edge to Output High Impedance tBSDHZ —50 ns 14 Boundary Scan Input Valid to TCK Rising Edge tBSDST 50 — ns 15 TCK Rising Edge to Boundary Scan Input Invalid tBSDHT 50 — ns 1 JTAG timing specified at V DD = 1.08 V to 1.32 V, VDDE = 3.0 V to 3.6 V, VDD33 and VDDSYN = 3.0 V to 3.6 V, TA =TL to TH, and CL = 30 pF with DSC = 0b10, SRC = 0b00. These specifications apply to JTAG boundary scan only. See Table 32 for functional specifications. Table 31. JTAG pin AC electrical characteristics1 (continued) Spec Characteristic Symbol Min Max Unit TCK 1 2 3 3 2 |
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