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STM32F407IE 데이터시트(PDF) 129 Page - STMicroelectronics

부품명 STM32F407IE
상세설명  ARM Cortex-M4 32b MCUFPU, 210DMIPS, up to 1MB Flash/1924KB RAM, USB OTG HS/FS, Ethernet, 17 TIMs, 3 ADCs, 15 comm. interfaces & camera
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제조업체  STMICROELECTRONICS [STMicroelectronics]
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STM32F407IE 데이터시트(HTML) 129 Page - STMicroelectronics

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STM32F405xx, STM32F407xx
Electrical characteristics
Doc ID 022152 Rev 3
129/180
5.3.21
Temperature sensor characteristics
5.3.22
VBAT monitoring characteristics
5.3.23
Embedded reference voltage
The parameters given in Table 71 are derived from tests performed under ambient
temperature and VDD supply voltage conditions summarized in Table 13.
Table 69.
TS characteristics
Symbol
Parameter
Min
Typ
Max
Unit
TL
(1)
VSENSE linearity with temperature
-
±1
±2°C
Avg_Slope(1) Average slope
-
2.5
mV/°C
V25
(1)
Voltage at 25 °C
-
0.76
V
tSTART
(2)
Startup time
-
6
10
µs
TS_temp
(3)(2)
ADC sampling time when reading the temperature (1 °C accuracy)
10
-
-
µs
1.
Based on characterization, not tested in production.
2.
Guaranteed by design, not tested in production.
3.
Shortest sampling time can be determined in the application by multiple iterations.
Table 70.
VBAT monitoring characteristics
Symbol
Parameter
Min
Typ
Max
Unit
R
Resistor bridge for VBAT
-50-
K
Ω
Q
Ratio on VBAT measurement
-
2
-
Er(1)
Error on Q
–1
-
+1
%
TS_vbat
(2)(2)
ADC sampling time when reading the VBAT
1 mV accuracy
5-
-
µs
1.
Guaranteed by design, not tested in production.
2.
Shortest sampling time can be determined in the application by multiple iterations.
Table 71.
Embedded internal reference voltage
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
VREFINT
Internal reference voltage
–40 °C < TA < +105 °C 1.18
1.21
1.24
V
TS_vrefint
(1)
ADC sampling time when reading the
internal reference voltage
10
-
-
µs
VRERINT_s
(2)
Internal reference voltage spread over the
temperature range
VDD = 3 V
-
3
5
mV
TCoeff
(2)
Temperature coefficient
-
30
50
ppm/°C
tSTART
(2)
Startup time
-
6
10
µs
1.
Shortest sampling time can be determined in the application by multiple iterations.
2.
Guaranteed by design, not tested in production.



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