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DAC5687IPZP 데이터시트(PDF) 6 Page - Texas Instruments

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부품명 DAC5687IPZP
상세설명  16-BIT, 500 MSPS 2?? INTERPOLATING DUAL-CHANNEL DIGITAL-TO-ANALOG CONVERTER (DAC)
PDF  79 Pages
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제조업체  TI [Texas Instruments]
홈페이지  http://www.ti.com
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DAC5687IPZP 데이터시트(HTML) 6 Page - Texas Instruments

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ELECTRICAL CHARACTERISTICS (DC SPECIFICATIONS)
DAC5687
SLWS164E – FEBRUARY 2005 – REVISED SEPTEMBER 2006
THERMAL CHARACTERISTICS (continued)
over operating free-air temperature range (unless otherwise noted)
Thermal Conductivity
100 HTQFP
UNIT
θ
JC
Theta junction-to-case
0.12
°C/W
over recommended operating free-air temperature range, AVDD = 3.3 V, CLKVDD = 3.3 V, PLLVDD = 3.3 V, IOVDD = 3.3 V,
DVDD = 1.8 V, IOUTFS = 19.2 mA (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
RESOLUTION
16
Bits
DC ACCURACY(1)
1 LSB = IOUTFS/2
16
INL
Integral nonlinearity
±4
LSB
TMIN to TMAX
DNL
Differential nonlinearity
±4
LSB
ANALOG OUTPUT
Coarse gain linearity
±0.04
LSB
Worst-case error from ideal linearity
Fine gain linearity
±3
LSB
Offset error
Mid code offset
0.01
%FSR
Without internal reference
1
%FSR
Gain error
With internal reference
0.7
%FSR
With internal reference, dual DAC, and SSB
Gain mismatch
–2
2
%FSR
mode
Minimum full-scale output current(2)
2
mA
Maximum full-scale output current(2)
20
mA
AVDD –
AVDD
Output compliance range(3)
IOUTFS = 20 mA
V
0.5 V
+ 0.5 V
Output resistance
300
k
Output capacitance
5
pF
REFERENCE OUTPUT
Reference voltage
1.14
1.2
1.26
V
Reference output current(4)
100
nA
REFERENCE INPUT
VEXTIO
Input voltage range
0.1
1.25
V
Input resistance
1
M
Small signal bandwidth
1.4
MHz
Input capacitance
100
pF
TEMPERATURE COEFFICIENTS
ppm of
Offset drift
±1
FSR/
°C
Without internal reference
±15
ppm of
Gain drift
FSR/
°C
With internal reference
±30
ppm of
Reference voltage drift
±8
FSR/
°C
(1)
Measured differential across IOUTA1 and IOUTA2 or IOUTB1 and IOUTB2 with 25
Ω each to AVDD.
(2)
Nominal full-scale current, IOUTFS , equals 32× the IBIAS current.
(3)
The upper limit of the output compliance is determined by the CMOS process. Exceeding this limit may result in transistor breakdown,
resulting in reduced reliability of the DAC5687 device. The lower limit of the output compliance is determined by the load resistors and
full-scale output current. Exceeding the limits adversely affects distortion performance and integral nonlinearity.
(4)
Use an external buffer amplifier with high impedance input to drive any external load.
6
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Copyright © 2005–2006, Texas Instruments Incorporated
Product Folder Link(s): DAC5687



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